diff -r aa99f2208aad -r b8d18c84f71c localisation/uiftestfw/inc/appfwk_tmsteststep.h --- /dev/null Thu Jan 01 00:00:00 1970 +0000 +++ b/localisation/uiftestfw/inc/appfwk_tmsteststep.h Tue Aug 03 10:20:34 2010 +0100 @@ -0,0 +1,63 @@ +/* +* Copyright (c) 2008 Nokia Corporation and/or its subsidiary(-ies). +* All rights reserved. +* This component and the accompanying materials are made available +* under the terms of "Eclipse Public License v1.0" +* which accompanies this distribution, and is available +* at the URL "http://www.eclipse.org/legal/epl-v10.html". +* +* Initial Contributors: +* Nokia Corporation - initial contribution. +* +* Contributors: +* +* Description: +* +*/ + + +/** +@file +@test +@internalComponent +*/ + +#ifndef tmsteststep_ +#define tmsteststep_ + +#include +#include +#include +#include + +// default name that a test will be called if not specifically set in the calling object +_LIT(KUnknownSYMTestCaseIDName, "@SYMTestCaseID Unnamed test"); +_LIT(KUndefinedSYMTestCaseIDName, "@SYMTestCaseID is not defined"); +_LIT(KNotATestSYMTestCaseIDName, "This is not a test"); + +class CTmsTestStep : public CTestStep + { +public: + IMPORT_C CTmsTestStep(); + IMPORT_C virtual ~CTmsTestStep(); + IMPORT_C void CloseTMSGraphicsStep(); + IMPORT_C void MQCTest(TBool aCondition, const TText8* aFile, TInt aLine); + IMPORT_C void MQCTestL(TBool aCondition, const TText8* aFile, TInt aLine); + IMPORT_C void SetTestStepID(const TDesC& aStepName); + IMPORT_C void SetOverallTestStepID(const TDesC& aStepName); + IMPORT_C void RecordTestResultL(); + IMPORT_C void MultipleResultsForSameID(TBool aShowMultipleResults); + + static void DebugLogL(const TDesC8 &aText, const TDesC8 &aText1, TInt aPos); + static TInt DebugLogPosL(); +protected: + static TInt ReadNextLineL( RFile &aFile, TDes8 &aLine ); + void CleanUpAndWriteResults(); + TBuf8 iCurrentTestStepName; + TBool iStepPassFail; + TBool iShowMultipleResults; + CDesCArrayFlat* iTestStepNames; + RArray iTestStepPositions; + }; + +#endif /*tmsteststep_*/