/*

* Copyright (c) 2003-2009 Nokia Corporation and/or its subsidiary(-ies).

* All rights reserved.

* This component and the accompanying materials are made available

* under the terms of "Eclipse Public License v1.0"

* which accompanies this distribution, and is available

* at the URL "http://www.eclipse.org/legal/epl-v10.html".

*

* Initial Contributors:

* Nokia Corporation - initial contribution.

*

* Contributors:

*

* Description: 

*

*/

#if !defined(__T_SECONDNAME_H__)

    #define __T_SECONDNAME_H__

#include <e32base.h>

#include <e32def.h>

#include <e32test.h>

#include <f32file.h>

#include <s32file.h>

#include <s32mem.h>

#include <cntdb.h>

#include <cntdef.h>

#include <cntitem.h>

#include <cntfield.h>

#include <cntfldst.h>

#include <cntvcard.h>

#include <vtoken.h>

/** Parameter object to encapsulate test data. */

class TTestData

	{

public:

	TTestData(const TDesC8& aImportVCard, const TDesC8& aUpdateVCard, 

		const TDesC8& aVersitToken, const TUid aFieldUid, 

		const TDesC& aFieldContent, const TDesC& aUpdatedFieldContent,

		const TDesC& aImportFilename, const TDesC& aExportFilename);

	void SetVCardMapping(TUid aVCardMapping);

public:

	const TDesC8& iImportVCard;

	const TDesC8& iUpdateVCard;

	const TDesC8& iVersitToken;

	const TUid iFieldUid;

	const TDesC& iFieldContent;

	const TDesC& iUpdatedFieldContent;

	const TDesC& iImportFilename;

	const TDesC& iExportFilename;

	TUid iVCardMapping;

	};

/** Base class for new contact field vCard tests. */

class CNewFieldTestBase : public CBase

	{

public:

	~CNewFieldTestBase();

protected:

	CParserVCard* CreateVCardLC(const TDesC8& aContents);

	void WriteVCardL(const TDesC& aFileName, CParserVCard& aVCard);

	TBool CheckSingleFieldValue(CContactItemFieldSet& aFieldSet, TTestData& aTd, const TDesC& aExpectedValue);

	TContactItemId CreateContactL();

	CParserVCard* ParseVCardLC(const TDesC& aFilename);

	CArrayPtr<CContactItem>* ImportVCardLC(const TDesC& aFilename, TBool aConnectWhitespaceOption = ETrue);

	void ExportVCardL(const TDesC& aFilename, CArrayPtr<CContactItem>* aContactArray);

protected:

	void TestImportL(TTestData& aTd);

	void TestExportL(TTestData& aTd);

	void TestUpdateL(TTestData& aTd);

protected:

	CNewFieldTestBase(RTest& aTest, RFs& aFs);

	CNewFieldTestBase();

	void BaseConstructL();

protected:	

	CContactDatabase* iDb;

	RTest& iTest;

	RFs& iFs;

	};

/** Tests for second name field (X-EPOCSECONDNAME). */

class CSecondNameTest : public CNewFieldTestBase

	{

public:

	static CSecondNameTest* NewLC(RTest& aTest, RFs& aFs);

	void RunTestsL();

	~CSecondNameTest();

private:

	CSecondNameTest(RTest& aTest, RFs& aFs);

	void ConstructL();

	};

/** Tests for SIP identity field (X-SIP). */

class CSipIdTest : public CNewFieldTestBase

	{

public:

	static CSipIdTest* NewLC(RTest& aTest, RFs& aFs);

	void RunTestsL();

	~CSipIdTest();

private:

	CSipIdTest(RTest& aTest, RFs& aFs);

	void ConstructL();

	void RunTestCaseL(const TDesC8& aImportVCard, const TDesC8& aUpdateVCard, TUid aVCardMapping);

	};

/** Tests for Wireless Village identity field (X-WV-ID). */

class CWvIdTest : public CNewFieldTestBase

	{

public:

	static CWvIdTest* NewLC(RTest& aTest, RFs& aFs);

	void RunTestsL();

	~CWvIdTest();

private:

	CWvIdTest(RTest& aTest, RFs& aFs);

	void ConstructL();

	};

/** Test for fields limitation at import time - related to defect INC077129 */

class CFieldLimitationTest : public CNewFieldTestBase

	{

public:

	static CFieldLimitationTest* NewLC(RTest& aTest, RFs& aFs);

	void RunTestsL();

	~CFieldLimitationTest();

private:

	CFieldLimitationTest(RTest& aTest, RFs& aFs);

	void ConstructL();

	void RunTestCaseL(const TDesC8& aImportVCard, const TDesC8& aVersitToken, TUid aCardMapping, const TDesC16& aExpectedValue);

 	};

#endif