1 // Copyright (c) 2003-2009 Nokia Corporation and/or its subsidiary(-ies).

     2 // All rights reserved.

     3 // This component and the accompanying materials are made available

     4 // under the terms of "Eclipse Public License v1.0"

     5 // which accompanies this distribution, and is available

     6 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

     7 //

     8 // Initial Contributors:

     9 // Nokia Corporation - initial contribution.

    10 //

    11 // Contributors:

    12 //

    13 // Description:

    14 //

    15 

    16 #if !defined(__T_SECONDNAME_H__)

    17     #define __T_SECONDNAME_H__

    18 

    19  

    20 #include <e32base.h>

    21 #include <e32def.h>

    22 #include <e32test.h>

    23 #include <f32file.h>

    24 #include <s32file.h>

    25 #include <s32mem.h>

    26 #include <cntdb.h>

    27 #include <cntdef.h>

    28 #include <cntitem.h>

    29 #include <cntfield.h>

    30 #include <cntfldst.h>

    31 #include <cntvcard.h>

    32 #include <vtoken.h>

    33 

    34 /** Parameter object to encapsulate test data. */

    35 class TTestData

    36 	{

    37 public:

    38 	TTestData(const TDesC8& aImportVCard, const TDesC8& aUpdateVCard, 

    39 		const TDesC8& aVersitToken, const TUid aFieldUid, 

    40 		const TDesC& aFieldContent, const TDesC& aUpdatedFieldContent,

    41 		const TDesC& aImportFilename, const TDesC& aExportFilename);

    42 	void SetVCardMapping(TUid aVCardMapping);

    43 public:

    44 	const TDesC8& iImportVCard;

    45 	const TDesC8& iUpdateVCard;

    46 	const TDesC8& iVersitToken;

    47 	const TUid iFieldUid;

    48 	const TDesC& iFieldContent;

    49 	const TDesC& iUpdatedFieldContent;

    50 	const TDesC& iImportFilename;

    51 	const TDesC& iExportFilename;

    52 	TUid iVCardMapping;

    53 	};

    54 

    55 /** Base class for new contact field vCard tests. */

    56 class CNewFieldTestBase : public CBase

    57 	{

    58 public:

    59 	~CNewFieldTestBase();

    60 protected:

    61 	CParserVCard* CreateVCardLC(const TDesC8& aContents);

    62 	void WriteVCardL(const TDesC& aFileName, CParserVCard& aVCard);

    63 	TBool CheckSingleFieldValue(CContactItemFieldSet& aFieldSet, TTestData& aTd, const TDesC& aExpectedValue);

    64 	TContactItemId CreateContactL();

    65 	CParserVCard* ParseVCardLC(const TDesC& aFilename);

    66 	CArrayPtr<CContactItem>* ImportVCardLC(const TDesC& aFilename, TBool aConnectWhitespaceOption = ETrue);

    67 	void ExportVCardL(const TDesC& aFilename, CArrayPtr<CContactItem>* aContactArray);

    68 protected:

    69 	void TestImportL(TTestData& aTd);

    70 	void TestExportL(TTestData& aTd);

    71 	void TestUpdateL(TTestData& aTd);

    72 protected:

    73 	CNewFieldTestBase(RTest& aTest, RFs& aFs);

    74 	CNewFieldTestBase();

    75 	void BaseConstructL();

    76 protected:	

    77 	CContactDatabase* iDb;

    78 	RTest& iTest;

    79 	RFs& iFs;

    80 	};

    81 

    82 /** Tests for second name field (X-EPOCSECONDNAME). */

    83 class CSecondNameTest : public CNewFieldTestBase

    84 	{

    85 public:

    86 	static CSecondNameTest* NewLC(RTest& aTest, RFs& aFs);

    87 	void RunTestsL();

    88 	~CSecondNameTest();

    89 private:

    90 	CSecondNameTest(RTest& aTest, RFs& aFs);

    91 	void ConstructL();

    92 	};

    93 

    94 /** Tests for SIP identity field (X-SIP). */

    95 class CSipIdTest : public CNewFieldTestBase

    96 	{

    97 public:

    98 	static CSipIdTest* NewLC(RTest& aTest, RFs& aFs);

    99 	void RunTestsL();

   100 	~CSipIdTest();

   101 private:

   102 	CSipIdTest(RTest& aTest, RFs& aFs);

   103 	void ConstructL();

   104 	void RunTestCaseL(const TDesC8& aImportVCard, const TDesC8& aUpdateVCard, TUid aVCardMapping);

   105 	};

   106 

   107 /** Tests for Wireless Village identity field (X-WV-ID). */

   108 class CWvIdTest : public CNewFieldTestBase

   109 	{

   110 public:

   111 	static CWvIdTest* NewLC(RTest& aTest, RFs& aFs);

   112 	void RunTestsL();

   113 	~CWvIdTest();

   114 private:

   115 	CWvIdTest(RTest& aTest, RFs& aFs);

   116 	void ConstructL();

   117 	};

   118 

   119 /** Test for fields limitation at import time - related to defect INC077129 */

   120 class CFieldLimitationTest : public CNewFieldTestBase

   121 	{

   122 public:

   123 	static CFieldLimitationTest* NewLC(RTest& aTest, RFs& aFs);

   124 	void RunTestsL();

   125 	~CFieldLimitationTest();

   126 private:

   127 	CFieldLimitationTest(RTest& aTest, RFs& aFs);

   128 	void ConstructL();

   129 	void RunTestCaseL(const TDesC8& aImportVCard, const TDesC8& aVersitToken, TUid aCardMapping, const TDesC16& aExpectedValue);

   130  	};

   131 

   132 #endif