// Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

#include <e32test.h>

#include <ecom/ecom.h>

#include "ConvertDates.h"

_LIT(KTestName,"Basic Calcon tests.");

LOCAL_D RTest test(KTestName);

void mainL();

GLDEF_C TInt E32Main()

    {

	__UHEAP_MARK;

	CTrapCleanup* cleanupStack=CTrapCleanup::New();

	TRAPD(error,mainL());

	test(KErrNone == error);

	REComSession::FinalClose(); 

	delete cleanupStack;

	__UHEAP_MARKEND;

	return KErrNone;

    }

/**

@SYMTestCaseID PIM-TCCNMAIN-0001

 */

void mainL()

    {

	CConvertDates* convDates = CConvertDates::NewL();

	CleanupStack::PushL(convDates);

	convDates->iTest(convDates->IntegrityTestL());

 	TInt err=KErrNone;

 	TRAP(err,convDates->ConvertL(1));

 	convDates->iTest(err == KErrNone);

	TRAP(err,convDates->ConvertL(2));

 	convDates->iTest(err == KErrNone);

	convDates->iTest(convDates->CompareL());

	convDates->iTest.Start(_L("@SYMTestCaseID PIM-TCCNMAIN-0001"));

	convDates->iTest.End();

	convDates->iTest.Close();

	CleanupStack::PopAndDestroy(convDates);

	}