installationservices/swinstallationfw/test/securitytests/source/usifsecuritytests.cpp
branchRCL_3
changeset 65 7333d7932ef7
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/installationservices/swinstallationfw/test/securitytests/source/usifsecuritytests.cpp	Tue Aug 31 15:21:33 2010 +0300
@@ -0,0 +1,67 @@
+/*
+* Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of the License "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description: 
+*
+*/
+
+
+/**
+ @file
+ @test
+*/
+
+#include <captestframework/aprcaptestutility.h>
+#include "scrcomponentspecific.h"
+#include "scrreaduserdata.h"
+#include "scrallfiles.h"
+#include "scrwritedevicedata.h"
+#include "scrnonrestricted.h"
+#include "scrfilepathprotection.h"
+#include "stsfilepathprotection.h"
+#include "stsrollbackalltest.h"
+#include "scrpluginmanagement.h"
+#include "scrapparccomponentspecific.h"
+
+#include <s32file.h>
+
+// Factory function
+MCapabilityTestFactory* CapabilityTestFactoryL()
+	{
+	CDefaultCapabilityTestFactory* factory=new(ELeave) CDefaultCapabilityTestFactory();
+
+	factory->AddTestL(CScrComponentSpecificSecTest::NewL());
+	factory->AddTestL(CScrReadUserDataSecTest::NewL());
+	factory->AddTestL(CScrNonRestrictedSecTest::NewL());
+	factory->AddTestL(CScrPrivatePathProtectionSecTest::NewL());
+	factory->AddTestL(CScrTCBPathProtectionSecTest::NewL());
+	factory->AddTestL(CScrAllFilesSecTest::NewL());
+	factory->AddTestL(CScrWriteDeviceDataSecTest::NewL());
+	factory->AddTestL(CStsTCBPathProtectionSecTest::NewL());
+	factory->AddTestL(CStsPrivatePathProtectionSecTest::NewL());
+	factory->AddTestL(CStsPublicPathSecTest::NewL());
+	factory->AddTestL(CStsRollbackAllSecTest::NewL());
+	factory->AddTestL(CScrPluginManagementSecTest::NewL());
+	factory->AddTestL(CScrApparcComponentSpecificSecTest::NewL());
+
+	return factory;
+	}
+
+EXPORT_C MCapabilityTestFactory* CapabilityTestFactory()
+	{
+	MCapabilityTestFactory* factory=NULL;
+	TRAP_IGNORE(factory = CapabilityTestFactoryL());
+	return factory;
+	}
+
+