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appfw/uiftestfw/bwins/APPFWK_TEST_APPUIU.DEF
author William Roberts <williamr@symbian.org>
Fri, 23 Apr 2010 14:37:17 +0100
branchRCL_3
changeset 22 c82a39b81a38
parent 0 2e3d3ce01487
permissions -rw-r--r--
Rework addition of Symbian splash screen to reduce the source impact (uses SVG from Bug 2414) Notes: by using the OPTION SOURCEDIR parameter in the mifconv extension instructions, I can arrange to use the same source file name in sfimage, without having to export over the original Nokia file. This means that the name inside splashscreen.mbg is the same, which removes the need for the conditional compilation in SplashScreen.cpp, and gets rid of sf_splashscreen.mmp.
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EXPORTS
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	??0CAutoTestManager@@AAE@PAVMAutoTestApp@@@Z @ 1 NONAME ; CAutoTestManager::CAutoTestManager(class MAutoTestApp *)
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	__E32Dll @ 2 NONAME ABSENT ; CTestAppUi::CTestAppUi(class CTestStep *, class TDesC16 const &, int, int, int)
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	__E32Dll @ 3 NONAME ABSENT ; CTestCoeAppUi::CTestCoeAppUi(class CTestStep *)
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	??1CAutoTestManager@@UAE@XZ @ 4 NONAME ; CAutoTestManager::~CAutoTestManager(void)
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	??1CTestAppUi@@UAE@XZ @ 5 NONAME ; CTestAppUi::~CTestAppUi(void)
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	??1CTestCoeAppUi@@UAE@XZ @ 6 NONAME ; CTestCoeAppUi::~CTestCoeAppUi(void)
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	?ConstructL@CTestAppUi@@UAEXXZ @ 7 NONAME ; void CTestAppUi::ConstructL(void)
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	?ConstructL@CTestCoeAppUi@@QAEXXZ @ 8 NONAME ; void CTestCoeAppUi::ConstructL(void)
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	?FinishAllTestCases@CAutoTestManager@@QAEXW4TTestResult@1@@Z @ 9 NONAME ; void CAutoTestManager::FinishAllTestCases(enum CAutoTestManager::TTestResult)
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	?NewL@CAutoTestManager@@SAPAV1@PAVMAutoTestApp@@@Z @ 10 NONAME ; class CAutoTestManager * CAutoTestManager::NewL(class MAutoTestApp *)
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	?PreallocateHALBuffer@@YAXXZ @ 11 NONAME ; void PreallocateHALBuffer(void)
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	?ProcessCommandL@CTestAppUi@@MAEXH@Z @ 12 NONAME ; void CTestAppUi::ProcessCommandL(int)
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	?ReduceRect@CTestAppUi@@IBEXAAVTRect@@@Z @ 13 NONAME ; void CTestAppUi::ReduceRect(class TRect &) const
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	?SetTestCaseNumber@CAutoTestManager@@QAEXH@Z @ 14 NONAME ; void CAutoTestManager::SetTestCaseNumber(int)
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	?StartAutoTest@CAutoTestManager@@QAEXXZ @ 15 NONAME ; void CAutoTestManager::StartAutoTest(void)
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	?CloseAllPanicWindowsL@@YAXXZ @ 16 NONAME ; void CloseAllPanicWindowsL(void)
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	??0CTestAppUi@@QAE@PAVCTmsTestStep@@ABVTDesC16@@HHH@Z @ 17 NONAME ; CTestAppUi::CTestAppUi(class CTmsTestStep *, class TDesC16 const &, int, int, int)
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	??0CTestCoeAppUi@@QAE@PAVCTmsTestStep@@@Z @ 18 NONAME ; CTestCoeAppUi::CTestCoeAppUi(class CTmsTestStep *)
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	?RecordTestResultL@CTmsTestStep@@QAEXXZ @ 19 NONAME ; void CTmsTestStep::RecordTestResultL(void)
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	?MultipleResultsForSameID@CTmsTestStep@@QAEXH@Z @ 20 NONAME ; void CTmsTestStep::MultipleResultsForSameID(int)
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	??0CTmsTestStep@@QAE@XZ @ 21 NONAME ; CTmsTestStep::CTmsTestStep(void)
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	?MQCTest@CTmsTestStep@@QAEXHPBEH@Z @ 22 NONAME ; void CTmsTestStep::MQCTest(int, unsigned char const *, int)
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	??1CTmsTestStep@@UAE@XZ @ 23 NONAME ; CTmsTestStep::~CTmsTestStep(void)
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	?SetTestStepID@CTmsTestStep@@QAEXABVTDesC16@@@Z @ 24 NONAME ; void CTmsTestStep::SetTestStepID(class TDesC16 const &)
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	?MQCTestL@CTmsTestStep@@QAEXHPBEH@Z @ 25 NONAME ; void CTmsTestStep::MQCTestL(int, unsigned char const *, int)
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	?CloseTMSGraphicsStep@CTmsTestStep@@QAEXXZ @ 26 NONAME ; void CTmsTestStep::CloseTMSGraphicsStep(void)
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	?SetOverallTestStepID@CTmsTestStep@@QAEXABVTDesC16@@@Z @ 27 NONAME ; void CTmsTestStep::SetOverallTestStepID(class TDesC16 const &)
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FCL/sf/mw/appsupport