appfw/apparchitecture/tef/T_IntegritySupportStep.h
changeset 0 2e3d3ce01487
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/appfw/apparchitecture/tef/T_IntegritySupportStep.h	Tue Feb 02 10:12:00 2010 +0200
@@ -0,0 +1,55 @@
+// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @internalComponent - Internal Symbian test code 
+*/
+
+ 
+#ifndef __T_INTEGRITYSUPPORT_STEP_H__
+#define __T_INTEGRITYSUPPORT_STEP_H__
+
+#include "t_abstractnonnativeappsstep.h"
+
+_LIT(KT_IntegritySupportStep,"T_IntegritySupport");
+
+class CT_IntegritySupportTestStep : public CT_AbstractNonNativeAppsTestStep
+	{
+public:
+	CT_IntegritySupportTestStep();
+	~CT_IntegritySupportTestStep();
+	virtual TVerdict doTestStepPreambleL();
+	virtual TVerdict doTestStepPostambleL();
+	virtual TVerdict doTestStepL();
+
+private:
+	TInt RunTestCasesL();
+	void TestNormalInstallation1L();
+	void TestManualRollback1L();
+	void TestRollbackOnError1L();
+	void TestRollbackOnSessionCloseL();
+	void TestNormalRemoval1L();
+	void TestManualRollback2L();
+	void TestRollbackWithoutPrepareL();
+	void TestRegisterWithoutPrepareL();
+	void TestCallingPrepareTwiceL();
+	void TestCallingPrepareFromTwoSessionsL();
+	void TestReregisterApplicationL();
+	void TestDoubleInstallFailsL();
+	void TestRollbackOnFailedUpdateStepL();
+	};
+	
+#endif