diff -r 000000000000 -r 2e3d3ce01487 appfw/apparchitecture/tef/T_OOMStep.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/appfw/apparchitecture/tef/T_OOMStep.h	Tue Feb 02 10:12:00 2010 +0200
@@ -0,0 +1,67 @@
+// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file 
+ @internalComponent - Internal Symbian test code  
+*/
+
+#if (!defined __T_OOM_STEP_H__)
+#define __T_OOM_STEP_H__
+
+#include "apparctestserver.h"
+
+//!  A CT_OOMStep test class. 
+
+/**  Performs the Out of Memory Tests. */
+
+class CT_OOMStep : public CTestStep
+	{
+public:
+	CT_OOMStep();
+	~CT_OOMStep();
+	virtual TVerdict doTestStepPreambleL();
+	virtual TVerdict doTestStepPostambleL();
+	virtual TVerdict doTestStepL();
+	void DoStepTests();
+
+//private:
+	CApaDocument* CreateTestDocL(CApaProcess* aProcess);
+	void CreateTestDocFileL();
+	void TestOOMConstructionL();
+	void TestDoorOOML();
+	void DoTestsInCallBackL();
+	void setup();
+	
+private:
+	RFs iFs;
+	};
+
+class CT_OOMStepCallBack : public CBase
+	{
+public:
+	CT_OOMStepCallBack(CT_OOMStep* aTestStep);
+	~CT_OOMStepCallBack();
+	static TInt CallBack(TAny* aThis);
+	CT_OOMStep* iTestStep;
+	};
+
+
+
+_LIT(KT_OOMStep,"T_OOM");
+
+#endif
+
+