diff -r 000000000000 -r 2f259fa3e83a commonuisupport/grid/tef/TGlayStep.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/commonuisupport/grid/tef/TGlayStep.h	Tue Feb 02 01:00:49 2010 +0200
@@ -0,0 +1,46 @@
+// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @internalComponent - Internal Symbian test code  
+*/
+
+#if (!defined __TGlay_STEP_H__)
+#define __TGlay_STEP_H__
+#include "TGridTestServer.h"
+#include "grdstd.h"
+#include "appfwk_tmsteststep.h"
+//! A CTestStep derived class 
+/*!
+	Incorporates the grid layout tests.\n
+*/
+class CTGlayStep : public CTmsTestStep
+	{
+public:
+	CTGlayStep();
+	~CTGlayStep();
+//	virtual TVerdict doTestStepPreambleL();
+//	virtual TVerdict doTestStepPostambleL();
+	virtual TVerdict doTestStepL();
+	void Test1L();
+	void Test2L();
+private:
+	void ConstructGridLayLC(CGridLay*& aGridLay);
+	};
+
+_LIT(KTGlayStep,"TGlay");
+#endif
+