// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

/**

 @file

 @test

 @internalComponent - Internal Symbian test code

*/

#ifndef __SSMCLETESTAPP_H

#define __SSMCLETESTAPP_H

#include "ssmtestapps.h"

const TInt KSsmCleTestPanic = 999;

enum TCleTestFailHow

	{

	EDontFail,

	EPanic,

	ENoRendezvous,

	EBadRendezvous,

	EBadPath,

	EMultipleTimeout

	};

struct TSsmCleTestAppArgs

	{

	TBuf<KTestCommandLineMaxLength> iLogPrefix;

	TInt iWaitTime;

	TInt iSucceedOnRun;

	TCleTestFailHow iFailHow;

	};

class XSsmCleTestApp

	{

public:

	static void WriteStartTimeL(RFs aFs, const TDesC& aLogPrefix);

	static TInt GetRunCountL(RFs aFs, const TDesC& aLogPrefix);

	static TInt IncrementRunCountL(RFs aFs, const TDesC& aLogPrefix);

	static void GetCommandLineArgsL(TSsmCleTestAppArgs& aArgStruct);

	static void WriteResultL(RFs aFs, const TDesC& aLogPrefix,const TCleTestFailHow& aFailHow);

	};

#endif // __SSMCLETESTAPP_H