// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

/**

@file

@test

@internalComponent

*/

#ifndef TTMSGRAPHICSSTEP_

#define TTMSGRAPHICSSTEP_

#include <test/testexecutestepbase.h>

#include <w32std.h>

#include <flogger.h>

#include <badesca.h> 

// default name that a test will be called if not specifically set in the calling object

_LIT(KUnknownSYMTestCaseIDName, "@SYMTestCaseID Unnamed test");

_LIT(KUndefinedSYMTestCaseIDName, "@SYMTestCaseID is not defined");

_LIT(KNotATestSYMTestCaseIDName, "This is not a test");

class CTMSDataColumn

{

public:

TBuf8<256> iTheID;

TBuf8<50> iTheResult;

};

class CTTMSGraphicsStep : public CTestStep

	{

public:

	IMPORT_C CTTMSGraphicsStep();

	IMPORT_C virtual ~CTTMSGraphicsStep();

	IMPORT_C void CloseTMSGraphicsStep();

	IMPORT_C void MQCTest(TBool aCondition, const TText8* aFile, TInt aLine);

	IMPORT_C void MQCTestL(TBool aCondition, const TText8* aFile, TInt aLine);

	IMPORT_C void SetTestStepID(const TDesC& aStepName);

	IMPORT_C void SetOverallTestStepID(const TDesC& aStepName);

	IMPORT_C void RecordTestResultL();

	IMPORT_C void MultipleResultsForSameID(TBool aShowMultipleResults);

	IMPORT_C void MQCTestWithErrorCode(TBool aCondition, TInt aErrorCode, const TText8* aFile, TInt aLine);

	void DebugLogL(const TDesC8 &aText, const TDesC8 &aText1);

protected:

	void CleanUpAndWriteResults();

	TBuf8<KMaxTestExecuteNameLength> iCurrentTestStepName;

	TBool iStepPassFail;

	TBool iShowMultipleResults;

	RArray<CTMSDataColumn> iArrayTMSData;

	};

#endif /*TTMSGRAPHICSSTEP_*/