// Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

/**

 @file

 @test

*/

#ifndef __EGLTEST_STRESS_PROCESS_SGIMAGE_H__

#define __EGLTEST_STRESS_PROCESS_SGIMAGE_H__

#include "egltest_stress_common_sgimage.h"

/**

Standard prototypes

*/

GLDEF_C TInt E32Main(void);

LOCAL_C void LaunchClientProcessL();

//Panic string

_LIT(KStressTestChildAppPanic, "Stress Test Child App");

class CTReadWriteChild : public CTReadWrite

    {

public:

    static CTReadWriteChild* NewL(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);

private:

    CTReadWriteChild(VGImage aImage, TInt aWidth, TInt aHeight, TInt aByteSize, VGImageFormat aFormat, const TTestType& aTestType, TBool& aTestPass);

    void ReadImageFuncL();

    void ReadFuncL();

    void WriteImageFuncL();

    void VgImageFuncL();

    void MakeCurrentL() const;

    TBool IsFinished();

    void PixmapSurfaceFuncL();

private:

    VGImage iImage;

    };

#endif //__EGLTEST_STRESS_PROCESS_SGIMAGE_H__