author | William Roberts <williamr@symbian.org> |
Tue, 20 Apr 2010 16:24:43 +0100 | |
branch | NewGraphicsArchitecture |
changeset 34 | 76efc8f9f7b4 |
parent 0 | 5d03bc08d59c |
permissions | -rw-r--r-- |
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// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies). |
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// All rights reserved. |
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// This component and the accompanying materials are made available |
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// under the terms of "Eclipse Public License v1.0" |
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// which accompanies this distribution, and is available |
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// at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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// |
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// Initial Contributors: |
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// Nokia Corporation - initial contribution. |
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// |
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// Contributors: |
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// |
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// Description: |
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// DEF075471 buffer security test |
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// |
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// |
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/** |
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@file |
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@test |
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@internalComponent - Internal Symbian test code |
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*/ |
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#ifndef __TBUFFERSECURITY_H__ |
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#define __TBUFFERSECURITY_H__ |
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#include "AUTO.H" |
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#include "../tlib/testbase.h" |
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#include <w32std.h> |
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#include "../SERVER/w32cmd.h" |
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#ifdef TEST_GRAPHICS_WSERV_TAUTOSERVER_NONNGA |
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#include "../nonnga/CLIENT/w32comm.h" |
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#endif |
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#ifdef TEST_GRAPHICS_WSERV_TAUTOSERVER_NGA |
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#include "../nga/CLIENT/w32comm.h" |
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#endif |
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#include <e32property.h> |
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#include "TGraphicsHarness.h" |
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//Set this #define to add extra logging to this test case (useful when debugging a test fail) |
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//#define _TBUFS_LOGGING |
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//Set this #define to initiate a long running soak test, this should be done periodically |
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//#define _TBUFS_TEST_SOAK_TEST |
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#ifdef _TBUFS_LOGGING |
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#define TBufSStartLogText StartLogText |
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#define TBufSLogText LogText |
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#define TBufSLogFormat LogFormat |
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#else |
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#define TBufSStartLogText |
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#define TBufSLogText |
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#define TBufSLogFormat |
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#endif |
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LOCAL_D const TUint KPanicThreadHeapSize=0x4000; |
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_LIT(KLitKernExec, "KERN-EXEC"); |
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_LIT(KTestName, "DEF086238 Buffer Security Test"); |
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static _LIT_SECURITY_POLICY_PASS(KAllowAllPolicy); |
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static _LIT_SECURITY_POLICY_C1(KWriteDeviceDataMgmtPolicy,ECapabilityWriteDeviceData); |
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const TInt KTestDataMax = 256; |
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const TInt KTestDataMax32 = KTestDataMax/4; |
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struct TTestThreadData |
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{ |
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TInt iOpCode; |
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union |
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{ |
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TUint8 iData[KTestDataMax]; |
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TUint32 iData32[KTestDataMax32]; |
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}; |
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TInt iDataLength; |
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}; |
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enum KBufSecTestType |
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{ |
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EBufSecUnInitialised, |
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EBufSecRandom, |
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EBufSecZero |
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}; |
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union TTestDataStore |
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{ |
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TAny *any; |
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TWsClCmdSetPointerCursorArea* cursorArea; |
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TWsClCmdHeapSetFail *heapSetFail; |
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TXYInputType *xyInputType; |
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}; |
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class CTBufferSecurity : public CTWsGraphicsBase |
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{ |
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public: |
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CTBufferSecurity(CTestStep* aStep); |
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~CTBufferSecurity(); |
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void TestWsBufferL(TInt aOpCode, TUint aDataFill, TBool aEightBit=ETrue); |
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void TestBadStringAnimDllL(); |
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void TestBadStringL(); |
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void TestBadIpcL(); |
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void ConstructL(); |
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protected: |
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//from CTGraphicsStep |
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virtual void RunTestCaseL(TInt aCurTestCase); |
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private: |
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void TestBufferSecurityL(); |
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}; |
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class RTestIpcSession : public RSessionBase |
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{ |
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public: |
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inline RTestIpcSession() {}; |
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TInt Connect(); |
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TInt SendBadBuffer(); |
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private: |
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TInt iWsHandle; |
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}; |
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class CTBufferSecurityStep : public CTGraphicsStep |
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{ |
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public: |
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CTBufferSecurityStep(); |
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protected: |
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//from CTGraphicsStep |
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virtual CTGraphicsBase* CreateTestL(); |
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}; |
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_LIT(KTBufferSecurityStep,"TBufferSecurity"); |
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#endif |