--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/graphicsdeviceinterface/directgdi/test/tbitbltmaskedbase.h	Tue Feb 02 01:47:50 2010 +0200
@@ -0,0 +1,81 @@
+// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @test
+ @internalComponent - Internal Symbian test code 
+*/
+
+#ifndef __TBITBLTMASKEDBASE_H__
+#define __TBITBLTMASKEDBASE_H__
+
+#include "tbitbltbase.h"
+
+
+/**
+Mask types
+*/
+enum TMaskType
+	{
+	EMaskL1,
+	EMaskL1Inv,
+	EMaskL8,
+	EMaskIterationEnd
+	};
+
+/**
+Base class for BitBltMasked() family tests.
+*/
+class CTBitBltMaskedBase : public CTBitBltBase
+	{
+public:
+	CTBitBltMaskedBase();
+	~CTBitBltMaskedBase();
+
+protected:
+	// base tests
+	void TestPositioningBaseL(const TDesC& aTestName, TBitBltFuncType aFunc);
+	void TestInvalidParametersBaseL(const TDesC& /*aTestName*/, TBitBltFuncType aFunc);
+	void TestSourceBitmapCloningBaseL(const TDesC& aTestName, TBitBltFuncType aFunc);
+	void TestMaskCloningBaseL(const TDesC& aTestName, TBitBltFuncType aFunc);
+
+	// helper functions
+	TInt WriteTargetOutput(TPtrC aTestCaseName);
+	void CreateBitmapsL(TUidPixelFormat aPixelFormat);
+	void DeleteBitmaps();
+
+	// iterate mask type
+	void BeginMaskIteration();
+	TBool NextMaskIteration();
+		
+protected:
+	CFbsBitmap* iNotInitialisedMask;
+	CFbsBitmap* iZeroSizeMask;
+	CFbsBitmap* iMask1L1;
+	CFbsBitmap* iMask2L1;
+	CFbsBitmap* iMask1L8;
+	CFbsBitmap* iMask2L8;
+	CFbsBitmap* iCompressedMaskL8;
+	CFbsBitmap* iBlackWhiteBitmap;
+	
+	TInt iMaskType;
+	TUidPixelFormat iMaskPixelFormat;
+	TBool iInvertMask;
+	CFbsBitmap* iCurrentMask1;
+	CFbsBitmap* iCurrentMask2;
+	};
+	
+#endif