author | Gareth Stockwell <gareth.stockwell@accenture.com> |
Fri, 22 Oct 2010 11:38:29 +0100 | |
branch | bug235_bringup_0 |
changeset 206 | c170e304623f |
parent 0 | 5d03bc08d59c |
permissions | -rw-r--r-- |
// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies). // All rights reserved. // This component and the accompanying materials are made available // under the terms of "Eclipse Public License v1.0" // which accompanies this distribution, and is available // at the URL "http://www.eclipse.org/legal/epl-v10.html". // // Initial Contributors: // Nokia Corporation - initial contribution. // // Contributors: // // Description: // /** @file @test @internalComponent - Internal Symbian test code */ #ifndef __TBITBLTMASKEDBASE_H__ #define __TBITBLTMASKEDBASE_H__ #include "tbitbltbase.h" /** Mask types */ enum TMaskType { EMaskL1, EMaskL1Inv, EMaskL8, EMaskIterationEnd }; /** Base class for BitBltMasked() family tests. */ class CTBitBltMaskedBase : public CTBitBltBase { public: CTBitBltMaskedBase(); ~CTBitBltMaskedBase(); protected: // base tests void TestPositioningBaseL(const TDesC& aTestName, TBitBltFuncType aFunc); void TestInvalidParametersBaseL(const TDesC& /*aTestName*/, TBitBltFuncType aFunc); void TestSourceBitmapCloningBaseL(const TDesC& aTestName, TBitBltFuncType aFunc); void TestMaskCloningBaseL(const TDesC& aTestName, TBitBltFuncType aFunc); // helper functions TInt WriteTargetOutput(TPtrC aTestCaseName); void CreateBitmapsL(TUidPixelFormat aPixelFormat); void DeleteBitmaps(); // iterate mask type void BeginMaskIteration(); TBool NextMaskIteration(); protected: CFbsBitmap* iNotInitialisedMask; CFbsBitmap* iZeroSizeMask; CFbsBitmap* iMask1L1; CFbsBitmap* iMask2L1; CFbsBitmap* iMask1L8; CFbsBitmap* iMask2L8; CFbsBitmap* iCompressedMaskL8; CFbsBitmap* iBlackWhiteBitmap; TInt iMaskType; TUidPixelFormat iMaskPixelFormat; TBool iInvertMask; CFbsBitmap* iCurrentMask1; CFbsBitmap* iCurrentMask2; }; #endif