graphicsdeviceinterface/directgdi/test/tdirectgdioom.h
author Pat Downey <patd@symbian.org>
Thu, 24 Jun 2010 11:26:02 +0100
changeset 102 f4d9a5ce4604
parent 0 5d03bc08d59c
permissions -rw-r--r--
Re-merge fixes for bug 1362, bug 1666, bug 1863, KhronosRI and bld.inf.

// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
// All rights reserved.
// This component and the accompanying materials are made available
// under the terms of "Eclipse Public License v1.0"
// which accompanies this distribution, and is available
// at the URL "http://www.eclipse.org/legal/epl-v10.html".
//
// Initial Contributors:
// Nokia Corporation - initial contribution.
//
// Contributors:
//
// Description:
//

/**
 @file
 @test
 @internalComponent - Internal Symbian test code 
*/

#ifndef TDIRECTGDIOOM_H_
#define TDIRECTGDIOOM_H_

#include "tdirectgdi_test_step_base.h"

/**
This class contains test cases that have been specifically written to
test out of memory (OOM) conditions only.

@internalComponent
@test
*/
class CTDirectGdiOom : public CTDirectGdiStepBase
	{
public:
	CTDirectGdiOom();
	~CTDirectGdiOom();
	
private:
	void TestDrawLargePolyLineL();
	void TestSetPenSizeL();
	
	// Helpers
	void FreeSgImagePixelFormatCache();
	
	
	// from CTDirectGdiStepBase
	TVerdict doTestStepPreambleL();
	TVerdict doTestStepL();
	void RunTestsL();
	};		
	
_LIT(KTDirectGdiOom, "TDirectGDIOOM");

#endif /*TDIRECTGDIOOM_H_*/