diff -r 000000000000 -r 5d03bc08d59c graphicsdeviceinterface/bitgdi/tbit/TDefect2.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/graphicsdeviceinterface/bitgdi/tbit/TDefect2.h	Tue Feb 02 01:47:50 2010 +0200
@@ -0,0 +1,94 @@
+// Copyright (c) 2003-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+#ifndef __TDEFECT2_H__
+#define __TDEFECT2_H__
+
+#include <bitdev.h>
+#include "TGraphicsHarness.h"
+
+//
+//
+//The main test class. Add your test methods here.
+class CTDefect2 : public CTGraphicsBase
+	{
+public:
+	CTDefect2(CTestStep* aStep);
+	~CTDefect2();
+	void TestL();
+protected:
+//from 	CTGraphicsStep
+	virtual void RunTestCaseL(TInt aCurTestCase);
+	void ConstructL();
+private:
+	void DEF039237L();
+	void DEF039331L();
+	void DEF039650L();
+	void ExerciseCopyRect();
+	TBool CopyRectReadOutsideBitmap(TInt aSingleMode =0,TInt aRetriesLeft =10);
+	
+	void GetPixelPerformance1L();
+	void RotateMoveTextL();
+	void SwapWidthAndHeightL();
+	void CreateScreenDeviceL();
+
+	void DoRotateMoveTextL();
+	void CreateScrDevAndContextL();
+	TInt CreateScrDevAndContext(TDisplayMode aDisplayMode);
+	TInt CreateScrDevAndContext(TInt aScreenNo, TDisplayMode aDisplayMode);
+	void DeleteScreenDevice();
+	void DeleteGraphicsContext();
+	void CreateBitmapL(const TSize& aSize, TDisplayMode aMode);
+	void DeleteBitmap();
+	void DeleteBitmapDevice();
+	void CreateFontL();
+	void DestroyFont();
+	void NonZeroOriginClearL();
+	void DEF115395L();
+	void TestDirtyMaskBitmapL();
+	void ZeroSizedPatternBrushL();
+	void CFbsBitGcInternalizeLFailL();
+	void PixelsToTwipsConversionCheck();
+	void CopyRectAlphaL();
+	void TestSetBitsL();
+    void TestMaskForAllCombinationL(TInt aChannelControl);
+    void TestMaskForSelectedValuesL(TInt aChannelControl);
+    void DoMaskTestL(TInt aSrcChannel, TInt aSrcMask, TInt aTargetMask, TInt aTargetChannel, TInt aChannelControl, CFbsBitmap* aSrcBmp, CFbsBitmap* aMaskBmp, CFbsBitmap* aTargetBmp, CBitmapContext* aTargetBmpContext);
+    void CheckValues(TUint aAlphaPixelValue, TUint aChannelPixelValue, TInt& aFailsPerPass, TInt aTargetMask, TInt aTargetChannel, TInt aSrcMask, TInt aSrcChannel, TInt aOtherMask, TUint* aReadPixel);
+    void LogColourEvent(TInt aPreMulDestPixColor,TInt aNonPreMulDestPixColor,TInt aPreMulSrcPixelColor,TInt aNonPreMulSrcPixelColor,TReal aVal1,TReal aVal2,TReal aVal3,TRefByValue<const TDesC> aMsg,TBool aErr);
+
+private:
+	CFbsScreenDevice* iScrDev;
+	CFbsBitGc* iGc;
+	TSize iSize;
+	TDisplayMode iCurrentMode;	
+	CFbsBitmap* iBitmap;
+	CFbsBitmapDevice* iBmpDevice;
+	};
+
+class CTDefect2Step : public CTGraphicsStep
+	{
+public:
+	CTDefect2Step();
+protected:	
+	//from CTGraphicsStep
+	virtual CTGraphicsBase* CreateTestL();
+	virtual void TestSetupL();
+	virtual void TestClose();
+	};
+
+_LIT(KTDefect2Step,"TDefect2");
+
+#endif