// Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of the License "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

// Global configuration for the tests

// 

//

#ifndef UTL_H

#define UTL_H

#include <e32test.h>

GLREF_D RTest test;

#define TEST_FOR_ERROR( r )	__testForError( r, __LINE__, __FILE__ )

#define __testForError(x,l,f) testForError(x,l,_S(f))

_LIT( KErrorFailString, "Test failed with error %d");

inline void testForError( TInt aCode, TInt aLine, const TText* aFileName )

	{

	if( aCode != KErrNone )

		{

		test.Printf( KErrorFailString, aCode );

		test.operator()( EFalse, aLine, aFileName );

		}

	}

#define TEST_FOR_MATCH( r, m ) __testForMatch( (TUint)(r), (TUint)(m), __LINE__, __FILE__ )

#define __testForMatch(r,m,l,f) testForMatch(r,m,l,_S(f))

_LIT( KMatchFailString, "Test failed, expected %d; got %d");

inline void testForMatch( TUint aValue, TUint aExpected, TInt aLine, const TText* aFileName )

	{

	if( aValue != aExpected )

		{

		test.Printf( KMatchFailString, aExpected, aValue );

		test.operator()( EFalse, aLine, aFileName );

		}

	}

#endif