--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32test/usbho/t_otgdi/inc/testcase0457.h	Mon Oct 19 15:55:17 2009 +0100
@@ -0,0 +1,71 @@
+#ifndef TESTCASE_0457_H
+#define TESTCASE_0457_H
+// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of the License "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// @internalComponent
+// Open/Close 'disconnected' test
+// 2. Call function to close OTGDI driver session.
+// 3. Repeat from step 1 (x 3)
+// 
+//
+
+//! @SYMTestCaseID				PBASE-T_OTGDI-0457
+//! @SYMTestCaseDesc			OTGDI driver session can be repeatedly opened and closed without a) panicking or b) leaking resources.
+//! @SYMFssID 
+//! @SYMPREQ					1782
+//! @SYMREQ						n/a
+//! @SYMTestType				UT
+//! @SYMTestPriority			1 
+//! @SYMTestActions 			1. A plug removed. Call function to open OTGDI driver session.
+//! @SYMTestExpectedResults 	No panic occurs, no error code returned, we get session handle; session gets closed
+//! @SYMTestStatus				Proto
+
+	class CTestCase0457 : public CTestCaseRoot
+	{
+public:
+	static CTestCase0457* NewL(TBool aHost);
+	virtual ~CTestCase0457(); 	
+
+	virtual void ExecuteTestCaseL();
+	void DoCancel();
+	void RunStepL();
+
+	virtual void DescribePreconditions();
+	TInt GetStepIndex()	{ return(iCaseStep); };
+		
+private:
+	CTestCase0457(TBool aHost);
+	void ConstructL();
+
+
+	// DATA
+private:
+	enum TCaseSteps
+		{
+		EPreconditions,
+		ELoadLdd,
+		EUnloadLdd,
+		ELoopDecrement,
+		ELastStep	
+		};
+	
+	TCaseSteps iCaseStep;
+	TInt       iRepeats;		// loop counter, set to run 3 times over
+	
+	const static TTestCaseFactoryReceipt<CTestCase0457> iFactoryReceipt;
+	
+	};
+	
+	
+#endif // TESTCASE_0457_H