--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/kerneltest/e32test/usbho/t_usbdi/inc/PBASE-T_USBDI-0488.h	Mon Oct 19 15:55:17 2009 +0100
@@ -0,0 +1,132 @@
+#ifndef __TEST_CASE_PBASE_T_USBDI_0488_H
+#define __TEST_CASE_PBASE_T_USBDI_0488_H
+
+/*
+* Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of the License "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description:
+* @file PBASE-T_USBDI-0488.h
+* @internalComponent
+* 
+*
+*/
+
+
+ 
+#include "basetestcase.h"
+#include "testcasefactory.h"
+#include "modelleddevices.h"
+#include "FDFActor.h"
+#include <d32usbc.h>
+#include <e32debug.h>
+#include <d32usbdi.h>
+#include "hosttransfers.h"
+#include "controltransferrequests.h"
+
+namespace NUnitTesting_USBDI
+	{
+
+/**
+
+	
+	@SYMTestCaseID				PBASE-T_USBDI-0488
+	@SYMTestCaseDesc			Resource cleanup following panic in client.
+	@SYMFssID 
+	@SYMPREQ					1782
+	@SYMREQ						7065 - [ USBD : Closing interface handles: Unclean shutdown (ie. kernel closes handle]
+	@SYMTestType				UT
+	@SYMTestPriority			1 
+	@SYMTestActions 			1. Enumerate
+                                2. Add heap mark
+                                3. Select alternate setting 1
+                                4. Open pipe for endpoint on interface 1
+                                5. Select alternate setting 0
+                                6. Validate panic cause (Interface setting changed while pipe is opened on other alternate setting)
+                                7. Close interface 1
+                                8. Check heap mark is equal to original mark
+    @SYMTestExpectedResults     Resources successfully cleaned up following a specific panic.	
+	@SYMTestStatus				Implemented
+	
+
+*/
+class CUT_PBASE_T_USBDI_0488 : public CBaseTestCase, public MUsbBusObserver, public MCommandObserver
+	{
+public:
+	static CUT_PBASE_T_USBDI_0488* NewL(TBool aHostRole);
+	~CUT_PBASE_T_USBDI_0488(); 
+
+public: // From MUsbBusObserver
+	void DeviceInsertedL(TUint aDeviceHandle);
+	void DeviceRemovedL(TUint aDeviceHandle);
+	void BusErrorL(TInt aError);
+	void DeviceStateChangeL(RUsbDevice::TDeviceState aPreviousState,RUsbDevice::TDeviceState aNewState,
+	TInt aCompletionCode);
+	
+
+public: // From MCommandObserver
+	void Ep0TransferCompleteL(TInt aCompletionCode);
+	
+private:
+	CUT_PBASE_T_USBDI_0488(TBool aHostRole);
+	void ConstructL();
+	void ExecuteHostTestCaseL();
+	void ExecuteDeviceTestCaseL();
+	void HostDoCancel();
+	void DeviceDoCancel();
+	void HostRunL();
+	void DeviceRunL();
+
+private:
+	enum TCaseStep 
+		{
+		EInProgress,
+		EFailed,
+		EPassed
+		};
+		
+public :
+
+	RUsbInterface iUsbInterface1;
+	
+	
+private:	
+	
+	CEp0Transfer* iControlEp0;
+	CActorFDF* iActorFDF;	
+	RUsbInterface iUsbInterface0;
+	RUsbPipe iInPipe;
+	// The current test case step
+	TCaseStep iCaseStep;
+	
+	// The test device for this test case
+	RUsbDeviceA* iTestDevice;
+	
+
+	
+private:
+	/**
+	The functor for this test case for the factory
+	*/
+	const static TFunctorTestCase<CUT_PBASE_T_USBDI_0488,TBool> iFunctor;
+	
+	/** 
+	static method, function of spawned thread.
+	@param[in] aTestCase pointer
+	*/	 
+	static TInt TestSelectAlternateInterfaceThenPanic(TAny* aTest);
+	};
+	
+	}
+
+
+#endif