#ifndef __TEST_CASE_PBASE_T_USBDI_0497_H
#define __TEST_CASE_PBASE_T_USBDI_0497_H
/*
* Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
* All rights reserved.
* This component and the accompanying materials are made available
* under the terms of the License "Eclipse Public License v1.0"
* which accompanies this distribution, and is available
* at the URL "http://www.eclipse.org/legal/epl-v10.html".
*
* Initial Contributors:
* Nokia Corporation - initial contribution.
*
* Contributors:
*
* Description:
* @file PBASE-T_USBDI-0497.h
* @internalComponent
*
*
*/
#include "BaseBulkTestCase.h"
namespace NUnitTesting_USBDI
{
const TUint8 KNumOutTransfersPerInterface = 2; //number of queued OUT transfers in used for each interface
const TUint8 KNumInTransfersPerInterface = 2; //number of queued IN transfers used for each interface
/**
@SYMTestCaseID PBASE-T_USBDI-0497
@SYMTestCaseDesc Test use of multiple bulk transfers doing a round trip on two interfaces
@SYMFssID
@SYMPREQ 1305
@SYMREQ 7055 [USBD : Bulk transfers]
@SYMTestType UT
@SYMTestPriority 1
@SYMTestActions 1. Open interfaces to connected device
2. Queue two bulk OUT transfer requests on each interface
3. On completion of OUT transfers queue two bulk IN transfer requests on each interface
4. Validate round trip data
5. Compare completion times for each bulk transfer
@SYMTestExpectedResults Round trip transfer data is not corrupt
@SYMTestStatus Draft
*/
class CUT_PBASE_T_USBDI_0497 : public CBaseBulkTestCase,
public MTransferObserver,
public MCommandObserver
{
public:
static CUT_PBASE_T_USBDI_0497* NewL(TBool aHostRole);
~CUT_PBASE_T_USBDI_0497();
public: // From MUsbBusObserver
void DeviceInsertedL(TUint aDeviceHandle);
public: // From MCommandObserver
void Ep0TransferCompleteL(TInt aCompletionCode);
public: // From MTransferObserver
void TransferCompleteL(TInt aTransferId,TInt aCompletionCode);
private:
CUT_PBASE_T_USBDI_0497(TBool aHostRole);
void ConstructL();
private:
enum TCaseStep
{
EInProgress,
EPassed,
EFailed,
ERequestDeviceRead,
ETransferOut,
ERequestDeviceWriteBack,
ETransferIn
};
// Transfer objects - use specific names for this test
CBulkTransfer* iIfc1InTransfer[KNumInTransfersPerInterface];
CBulkTransfer* iIfc1OutTransfer[KNumOutTransfersPerInterface];
CBulkTransfer* iIfc2InTransfer[KNumInTransfersPerInterface];
CBulkTransfer* iIfc2OutTransfer[KNumOutTransfersPerInterface];
TCaseStep iCaseStep;
private:
/**
The functor for this test case
*/
const static TFunctorTestCase<CUT_PBASE_T_USBDI_0497,TBool> iFunctor;
};
} //end namespace
#endif