diff -r 345b1ca54e88 -r 039a3e647356 kerneltest/e32utils/nistsecurerng/include/defs.h
--- a/kerneltest/e32utils/nistsecurerng/include/defs.h	Wed Sep 15 13:42:27 2010 +0300
+++ /dev/null	Thu Jan 01 00:00:00 1970 +0000
@@ -1,92 +0,0 @@
-/*
-* Portions Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).
-* All rights reserved.
-* This component and the accompanying materials are made available
-* under the terms of "Eclipse Public License v1.0"
-* which accompanies this distribution, and is available
-* at the URL "http://www.eclipse.org/legal/epl-v10.html".
-*
-* Initial Contributors:
-* Nokia Corporation - initial contribution.
-*
-* Contributors:
-*
-* Description: 
-* The original NIST Statistical Test Suite code is placed in public domain.
-* (http://csrc.nist.gov/groups/ST/toolkit/rng/documentation_software.html) 
-* 
-* This software was developed at the National Institute of Standards and Technology by 
-* employees of the Federal Government in the course of their official duties. Pursuant
-* to title 17 Section 105 of the United States Code this software is not subject to 
-* copyright protection and is in the public domain. The NIST Statistical Test Suite is
-* an experimental system. NIST assumes no responsibility whatsoever for its use by other 
-* parties, and makes no guarantees, expressed or implied, about its quality, reliability, 
-* or any other characteristic. We would appreciate acknowledgment if the software is used.
-*/
-
-/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * *
-                       D E B U G G I N G  A I D E S
- * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
-#ifndef _DEFS_H_
-#define _DEFS_H_
-
-#include "config.h"
-
-/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * *
-                              M A C R O S
- * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
-
-#define MAX(x,y)             ((x) <  (y)  ? (y)  : (x))
-#define MIN(x,y)             ((x) >  (y)  ? (y)  : (x))
-#define isNonPositive(x)     ((x) <= 0.e0 ?   1  : 0)
-#define isPositive(x)        ((x) >  0.e0 ?   1 : 0)
-#define isNegative(x)        ((x) <  0.e0 ?   1 : 0)
-#define isGreaterThanOne(x)  ((x) >  1.e0 ?   1 : 0)
-#define isZero(x)            ((x) == 0.e0 ?   1 : 0)
-#define isOne(x)             ((x) == 1.e0 ?   1 : 0)
-
-/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * 
-                         G L O B A L  C O N S T A N T S
- * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
-
-#define ALPHA							0.01	/* SIGNIFICANCE LEVEL */
-#define MAXNUMOFTEMPLATES				148		/* APERIODIC TEMPLATES: 148=>temp_length=9 */
-#define NUMOFTESTS						15		/* MAX TESTS DEFINED  */
-#define NUMOFGENERATORS					11		/* MAX PRNGs */
-#define MAXFILESPERMITTEDFORPARTITION	148
-#define	TEST_FREQUENCY					1
-#define	TEST_BLOCK_FREQUENCY			2
-#define	TEST_CUSUM						3
-#define	TEST_RUNS						4
-#define	TEST_LONGEST_RUN				5
-#define	TEST_RANK						6
-#define	TEST_FFT						7
-#define	TEST_NONPERIODIC				8
-#define	TEST_OVERLAPPING				9
-#define	TEST_UNIVERSAL					10
-#define	TEST_APEN						11
-#define	TEST_RND_EXCURSION				12
-#define	TEST_RND_EXCURSION_VAR			13
-#define	TEST_SERIAL						14
-#define	TEST_LINEARCOMPLEXITY			15
-
-
-/* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * *
-                   G L O B A L   D A T A  S T R U C T U R E S
- * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * */
-
-typedef unsigned char	BitSequence;
-
-typedef struct _testParameters {
-	int		n;
-	int		blockFrequencyBlockLength;
-	int		nonOverlappingTemplateBlockLength;
-	int		overlappingTemplateBlockLength;
-	int		serialBlockLength;
-	int		linearComplexitySequenceLength;
-	int		approximateEntropyBlockLength;
-	int		numOfBitStreams;
-} TP;
-
-#endif // _DEFS_H_
-