diff -r 000000000000 -r a41df078684a kerneltest/e32test/hcr/d_hcrut.h --- /dev/null Thu Jan 01 00:00:00 1970 +0000 +++ b/kerneltest/e32test/hcr/d_hcrut.h Mon Oct 19 15:55:17 2009 +0100 @@ -0,0 +1,97 @@ +// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies). +// All rights reserved. +// This component and the accompanying materials are made available +// under the terms of the License "Eclipse Public License v1.0" +// which accompanies this distribution, and is available +// at the URL "http://www.eclipse.org/legal/epl-v10.html". +// +// Initial Contributors: +// Nokia Corporation - initial contribution. +// +// Contributors: +// +// Description: +// Hardware Configuration Respoitory Tests +// + +#ifndef D_HCR_H +#define D_HCR_H + +#include +#include +#include + +#ifndef __KERNEL_MODE__ +#include +#endif + + +/** +Interface to the fast-trace memory buffer. +*/ +class RHcrTest : public RBusLogicalChannel + { +public: + +#ifndef __KERNEL_MODE__ + inline TInt Open() + { + return DoCreate(Name(),TVersion(0,1,1),KNullUnit,NULL,NULL,EOwnerThread); + } + + inline TUint Test_SanityTestWordSettings() + { + return DoControl(ECtrlSanityTestWordSettings); + } + + inline TUint Test_SanityTestLargeSettings() + { + return DoControl(ECtrlSanityTestLargeSettings); + } + + inline TUint Test_ReleaseSDRs() + { + return DoControl(ECtrlFreePhyscialRam); + } + + inline TUint Test_SwitchRepository() + { + return DoControl(ECtrlSwitchRepository); + } + + +#endif + + inline static const TDesC& Name(); + +private: + enum TControl + { + ECtrlUndefined = 0, + + ECtrlSanityTestWordSettings, + ECtrlSanityTestLargeSettings, + + ECtrlGetWordSetting, + ECtrlGetLargeSetting, + ECtrlGetManyWordSettings, + ECtrlGetManyLargeSettings, + + ECtrlSwitchRepository, + + ECtrlFreePhyscialRam + }; + + friend class DHcrTestChannel; + friend class DHcrTestFactory; + }; + +inline const TDesC& RHcrTest::Name() + { + _LIT(KTestDriver,"d_hcr"); + return KTestDriver; + } + + + +#endif // D_HCR_H