// Copyright (c) 2001-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

// MEMORY LEAK TESTING - Change and recompile to enable memory leak testing

// #define __MEMORY_LEAK_TESTING_ENABLED

// System includes

//

#include <e32base.h>

// Local include

//

#include "IpuTestUtils.h"

#include "CUriAndAuthorityTest.h"

#include "CDelimitedPathTest.h"

#include "CDelimitedPathSegmentTest.h"

#include "CDelimitedQueryTest.h"

#include "CEscapeUtilsTest.h"

#include "CTextUtilsTest.h"

#include "CUriUtilsTest.h"

#include "CSipUriAndAuthorityTest.h"

// Constants and definions

//

_LIT(KUriParserTestPanic, "T_Uri");

_LIT(KUriTestTitle, "T_Uri Test Harness");

GLDEF_C void Panic(TInt aPanic);

//	Local/Global function implementations

//

GLDEF_C void Panic(TInt aPanic)

//

//	Panic the client program.

	{

	User::Panic(KUriParserTestPanic,aPanic);

	}

GLDEF_C void TestL()

	{

	CIpuTestHarness* testHarness = CIpuTestHarness::NewL(KUriTestTitle);

	CleanupStack::PushL(testHarness);

	testHarness->DoResourceLeakTest(ETrue);

	testHarness->LogIt(_L ("@SYMTestCaseID IWS-APPPROTOCOLS-INETPROTUTIL-T_URIPARSERMAIN-0001 "));

	CEscapeUtilsTest* escapeUtilsTest = CEscapeUtilsTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*escapeUtilsTest,*testHarness);

#endif

	escapeUtilsTest->DoTestsL();

	CTextUtilsTest* textUtilsTest = CTextUtilsTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*textUtilsTest,*testHarness);

#endif

	textUtilsTest->DoTestsL();

	CUriUtilsTest* uriUtilsTest = CUriUtilsTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*uriUtilsTest,*testHarness);

#endif

	uriUtilsTest->DoTestsL();

	CUriAndAuthorityTest* uriAndAuthorityTest = CUriAndAuthorityTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*uriAndAuthorityTest,*testHarness);

#endif

	uriAndAuthorityTest->DoTestsL();

	CDelimitedPathTest* delimitedPathTest = CDelimitedPathTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*delimitedPathTest,*testHarness);

#endif

	delimitedPathTest->DoTestsL();

	CDelimitedPathSegmentTest* delimitedPathSegmentTest = CDelimitedPathSegmentTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*delimitedPathSegmentTest,*testHarness);

#endif

	delimitedPathSegmentTest->DoTestsL();

	CDelimitedQueryTest* delimitedQueryTest = CDelimitedQueryTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*delimitedQueryTest,*testHarness);

#endif

	delimitedQueryTest->DoTestsL();

	CSipUriAndAuthorityTest* sipUriAndAuthorityTest = CSipUriAndAuthorityTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*sipUriAndAuthorityTest,*testHarness);

#endif

	sipUriAndAuthorityTest->DoTestsL();

	CleanupStack::PopAndDestroy(9, testHarness);	//	lots!

	}

GLDEF_C TInt E32Main()

//

// Main function

	{

	__UHEAP_MARK;

	CTrapCleanup* tc=CTrapCleanup::New();

	TRAPD(err,TestL());

	if (err!=KErrNone)

		User::Panic(_L("Failed to complete test"),err);

	delete tc;

	__UHEAP_MARKEND;

	return KErrNone;

	}