// Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

// t_main

// Main test harness for t_tinternetdate

// 

//

// MEMORY LEAK TESTING - Change and recompile to enable memory leak testing

// #define __MEMORY_LEAK_TESTING_ENABLED

#include <e32base.h>

#include "IpuTestUtils.h"

#include "cconverttorfc1123formtest.h"

_LIT(KTestPanic, "TInetDate");

_LIT(KTestTitle, "T_TInternetDate");

GLDEF_C void Panic(TInt aPanic);

GLDEF_C void Panic(TInt aPanic)

	{

	User::Panic(KTestPanic,aPanic);

	}

GLDEF_C void TestL()

	{

	CIpuTestHarness* testHarness = CIpuTestHarness::NewL(KTestTitle);

	CleanupStack::PushL(testHarness);

	testHarness->DoResourceLeakTest(ETrue);

	testHarness->LogIt(_L ("@SYMTestCaseID IWS-APPPROTOCOLS-INETPROTUTIL-T_TINTERNETDATE-0001 "));

	CConvertToRfc1123FormTest* convertToRfc1123FormTest = CConvertToRfc1123FormTest::NewLC(testHarness);

#ifdef __MEMORY_LEAK_TESTING_ENABLED

	CTestBase::MemoryLeakTestL(*convertToRfc1123FormTest,*testHarness);

#endif

	convertToRfc1123FormTest->DoTestsL();

	CleanupStack::PopAndDestroy(2, testHarness);

	}

GLDEF_C TInt E32Main()

//

// Main function

	{

	__UHEAP_MARK;

	CTrapCleanup* tc=CTrapCleanup::New();

	TRAPD(err,TestL());

	if (err!=KErrNone)

		User::Panic(_L("Test Fail"),err);

	delete tc;

	__UHEAP_MARKEND;

	return KErrNone;

	}