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1 // Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies). |
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2 // All rights reserved. |
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3 // This component and the accompanying materials are made available |
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4 // under the terms of "Eclipse Public License v1.0" |
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5 // which accompanies this distribution, and is available |
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6 // at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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7 // |
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8 // Initial Contributors: |
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9 // Nokia Corporation - initial contribution. |
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10 // |
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11 // Contributors: |
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12 // |
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13 // Description: |
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14 // |
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15 |
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16 #include <string.h> |
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17 #include <e32test.h> //this includes e32cmn.h |
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18 #include <e32debug.h> |
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19 |
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20 #include <sys/types.h> |
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21 #include <sys/socket.h> |
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22 #include <sys/ioctl.h> |
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23 #include <libc/netinet/in.h> |
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24 #include <libc/arpa/inet.h> |
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25 #include <limits.h> |
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26 |
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27 #include <sys/errno.h> |
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28 #include <stdlib.h> |
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29 #include <math.h> |
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30 |
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31 LOCAL_D RTest TheTest (_L("T_StdlibDefect")); |
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32 // |
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33 // |
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34 //Test macroses and functions |
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35 |
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36 static void Check(TInt aValue, TInt aLine) |
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37 { |
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38 if(!aValue) |
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39 { |
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40 TheTest(EFalse, aLine); |
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41 } |
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42 } |
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43 static void Check(TInt aValue, TInt aExpected, TInt aLine) |
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44 { |
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45 if(aValue != aExpected) |
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46 { |
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47 RDebug::Print(_L("*** Expected error: %d, got: %d\r\n"), aExpected, aValue); |
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48 TheTest(EFalse, aLine); |
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49 } |
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50 } |
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51 #define TEST(arg) ::Check((arg), __LINE__) |
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52 #define TEST2(aValue, aExpected) ::Check(aValue, aExpected, __LINE__) |
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53 |
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54 |
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55 |
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56 const TInt KTestDataLen = 10000; |
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57 const TInt KTestIterations = 1000; |
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58 |
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59 #ifdef __ARMCC__ |
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60 const TInt KMinCharARMCC = 0; |
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61 const TInt KMaxCharARMCC = 255; |
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62 #else |
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63 const TInt KMinCharNoARMCC = -128; |
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64 const TInt KMaxCharNoARMCC = 127; |
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65 #endif |
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66 |
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67 /** |
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68 DEF062679 : memcpy in stdlib is slow |
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69 */ |
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70 void Defect_DEF062679_memcpy() |
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71 { |
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72 |
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73 TUint8* src1 = new TUint8[KTestDataLen]; |
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74 TEST(src1 != NULL); |
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75 Mem::Fill(src1, KTestDataLen, 'A'); |
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76 |
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77 TUint8* dst1 = new TUint8[KTestDataLen]; |
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78 TEST(dst1 != NULL); |
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79 |
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80 TTime startTime, stopTime; |
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81 TInt i; |
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82 //Loop to check time spent using Mem::Copy |
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83 startTime.UniversalTime(); |
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84 for(i=0; i<KTestIterations ; i++) |
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85 Mem::Copy(dst1, src1, KTestDataLen ); |
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86 stopTime.UniversalTime(); |
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87 TTimeIntervalMicroSeconds timeTaken = stopTime.MicroSecondsFrom(startTime); |
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88 TheTest.Printf(_L("Time taken using Mem::Copy :%d microseconds\n"), timeTaken.Int64() ); |
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89 |
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90 //Loop to check the time spent using memcpy after the change |
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91 startTime.UniversalTime(); |
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92 for(i=0; i<KTestIterations ; i++) |
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93 memcpy(dst1, src1, KTestDataLen ); |
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94 stopTime.UniversalTime(); |
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95 TTimeIntervalMicroSeconds timeTaken2 = stopTime.MicroSecondsFrom(startTime); |
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96 TheTest.Printf(_L("Time taken using memcpy: %d microseconds\n"), timeTaken2.Int64() ); |
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97 TheTest.Printf(_L("Time taken using memcpy before the change about 613125 microseconds\n")); |
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98 |
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99 //Test memcpy works fine |
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100 for(i=0; i<KTestIterations ; i++) |
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101 TEST(dst1[i] == src1[i]); |
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102 |
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103 delete [] src1; |
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104 delete [] dst1; |
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105 |
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106 } |
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107 |
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108 |
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109 |
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110 |
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111 /** |
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112 DEF062679 : memcpy in stdlib is slow |
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113 */ |
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114 void Defect_DEF062679_memcmp() |
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115 { |
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116 |
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117 TUint8* str1 = new TUint8[KTestDataLen]; |
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118 TEST(str1 != NULL); |
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119 Mem::Fill(str1, KTestDataLen, 'A'); |
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120 |
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121 TUint8* str2 = new TUint8[KTestDataLen]; |
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122 TEST(str2 != NULL); |
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123 Mem::Fill(str2, KTestDataLen, 'A'); |
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124 |
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125 TTime startTime, stopTime; |
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126 |
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127 //Loop to check the time using Mem::Copy |
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128 startTime.UniversalTime(); |
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129 TInt i,ret; |
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130 for(i=0; i<KTestIterations ; i++) |
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131 ret = Mem::Compare(str2,KTestDataLen, str1, KTestDataLen ); |
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132 stopTime.UniversalTime(); |
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133 TTimeIntervalMicroSeconds timeTaken = stopTime.MicroSecondsFrom(startTime); |
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134 TheTest.Printf(_L("Time taken using Mem::Compare :%ld microseconds\n"), timeTaken.Int64() ); |
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135 |
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136 //Loop to check the time spent using memcpy after the change |
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137 startTime.UniversalTime(); |
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138 |
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139 for(i=0; i<KTestIterations ; i++) |
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140 ret = memcmp(str2,str1, KTestDataLen ); |
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141 TEST(ret==0); //check that memcmp works fine |
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142 stopTime.UniversalTime(); |
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143 TTimeIntervalMicroSeconds timeTaken2 = stopTime.MicroSecondsFrom(startTime); |
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144 TheTest.Printf(_L("Time taken using memcmp: %ld microseconds\n"), timeTaken2.Int64() ); |
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145 |
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146 TheTest.Printf(_L("Time taken using memcmp before changes 1007000 microseconds\n")); |
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147 |
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148 |
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149 //Test memcmp works fine |
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150 |
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151 TUint8* str3 = new TUint8[KTestDataLen]; |
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152 TEST(str3 != NULL); |
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153 Mem::Fill(str3, KTestDataLen, 'B'); |
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154 ret = memcmp(str3, str1, KTestDataLen); |
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155 TEST(ret>0); |
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156 ret = memcmp(str1, str3, KTestDataLen); |
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157 TEST(ret<0); |
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158 |
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159 delete str1; |
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160 delete str2; |
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161 delete str3; |
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162 } |
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163 |
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164 /** |
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165 INC073740: inet_addr and inet_aton returns wrong results with invalid input on STDLIB |
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166 */ |
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167 void Defect_INC073740() |
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168 { |
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169 TheTest.Next(_L("INC073740: inet_addr and inet_aton returns wrong results with invalid input on STDLIB")); |
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170 |
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171 int err; |
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172 struct in_addr iaddr; |
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173 char* good_addr="16.33.50.67"; |
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174 char* bad_addr="256.33.50.67"; |
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175 char* worse_addr="16.1456.50.67"; |
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176 char* worst_addr="16.33.333333.67"; |
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177 |
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178 err=inet_aton(good_addr, &iaddr); |
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179 TEST2(err, 1); |
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180 |
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181 err=inet_aton(bad_addr, &iaddr); |
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182 TEST2(err, 0); |
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183 |
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184 err=inet_aton(worse_addr, &iaddr); |
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185 TEST2(err, 0); |
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186 |
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187 err=inet_aton(worst_addr, &iaddr); |
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188 TEST2(err, 0); |
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189 } |
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190 |
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191 /** |
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192 @SYMTestCaseID SYSLIB-STDLIB-CT-1863 |
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193 @SYMTestCaseDesc Tests for minimum and maximum values type "char" with ARMCC macro |
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194 @SYMTestPriority High |
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195 @SYMTestActions Tests for checking minimum and maximum values for a variable of type "char" |
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196 @SYMTestExpectedResults Tests must not fail |
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197 @SYMDEF PDEF091928 |
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198 */ |
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199 void Defect_PDEF091928() |
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200 { |
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201 TheTest.Next(_L(" @SYMTestCaseID:SYSLIB-STDLIB-CT-1863 PDEF091928: limits.h not correct for ARM RVCT compiler ")); |
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202 |
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203 char charmn=CHAR_MIN; |
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204 char charmx=CHAR_MAX; |
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205 |
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206 #ifdef __ARMCC__ |
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207 |
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208 TEST2(charmn, KMinCharARMCC); |
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209 TEST2(charmx, KMaxCharARMCC); |
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210 |
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211 #else |
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212 |
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213 TEST2(charmn, KMinCharNoARMCC); |
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214 TEST2(charmx, KMaxCharNoARMCC); |
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215 |
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216 #endif |
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217 } |
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218 |
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219 /** |
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220 @SYMTestCaseID SYSLIB-STDLIB-UT-3612 |
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221 @SYMTestCaseDesc Tests for __errno(). |
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222 @SYMTestPriority Normal |
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223 @SYMTestActions Tests for __errno(). Test whether it is correctly exported and functioning |
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224 as expected after being declared with IMPORT_C. |
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225 @SYMTestExpectedResults Tests must not fail |
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226 @SYMDEF DEF110593 |
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227 */ |
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228 void Defect_DEF110593() |
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229 { |
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230 TheTest.Next(_L(" @SYMTestCaseID:SYSLIB-STDLIB-UT-3612 DEF110593: IMPORT_C/EXPORT_C: ERRNO.H ")); |
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231 |
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232 // randomly selected 24 macros from errno.h |
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233 const int errMacros[24] = |
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234 { |
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235 EPERM, ENOENT, ESRCH, EINTR, EIO, |
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236 EBADF, ENOMEM, EFAULT, EBUSY, ENOTDIR, |
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237 ENFILE, ESPIPE, ERANGE, ENOMSG, EDEADLK, |
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238 ENOLCK, ENOTSOCK, ENOLINK, EBADMSG, ENOTUNIQ, |
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239 EBADFD, ENOSYS, EILSEQ, __ELASTERROR |
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240 }; |
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241 |
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242 // Step 1: setting errno using assign "=", test value returned by errno |
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243 errno = 0; |
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244 TEST(errno == 0); |
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245 |
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246 int i; |
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247 for (i = 0; i < 24; i++) |
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248 { |
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249 errno = errMacros[i]; |
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250 TEST(errno == errMacros[i]); |
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251 } |
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252 |
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253 // Step 2: setting errno using the library globals struct, test value returned by errno |
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254 struct _reent *r = _REENT2; |
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255 r->_errno = 0; |
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256 TEST(errno == 0); |
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257 |
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258 for (i = 0; i < 24; i++) |
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259 { |
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260 r->_errno = errMacros[i]; |
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261 TEST(errno == errMacros[i]); |
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262 } |
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263 |
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264 r->_errno = 0; |
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265 TEST(errno == 0); |
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266 |
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267 // Step3: Test errno by using other C function in STDLIB |
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268 // Test using ldexp(double value, int exp); |
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269 // Giving val a huge number to make res overflow. errno should return ERANGE |
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270 double val = 1.5E+308; |
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271 int exp = 10; |
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272 ldexp(val, exp); |
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273 TEST(errno == ERANGE); |
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274 |
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275 //finish |
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276 CloseSTDLIB(); |
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277 } |
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278 |
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279 /** |
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280 @SYMTestCaseID SYSLIB-STDLIB-CT-4001 |
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281 @SYMTestCaseDesc Test strtoul() with a string whose first character is '-' or '+'. |
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282 @SYMTestPriority 3. Medium |
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283 @SYMTestActions Test strtoul() with a string whose first character is '-' or '+'. |
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284 @SYMTestExpectedResults Tests must not fail |
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285 @SYMDEF PDEF114447 |
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286 */ |
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287 void Defect_PDEF114447 () |
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288 { |
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289 TheTest.Next(_L(" @SYMTestCaseID:SYSLIB-STDLIB-CT-4001 PDEF114447 : add the processing for '-' and '+' in a string passed to strtoul() ")); |
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290 |
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291 unsigned long result; |
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292 |
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293 result = strtoul("+80", NULL, 10); |
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294 TEST2(result, 80); |
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295 |
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296 result = strtoul("-80", NULL, 10); |
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297 TEST2(result, -80); |
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298 } |
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299 |
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300 /** |
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301 Calls ImpurePtr2() to allocate memory for the library globals struct then calls CloseSTDLIB() |
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302 to release it. |
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303 Leaves if system-wide error occurs. |
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304 */ |
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305 LOCAL_C void TestImpurePtrL() |
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306 { |
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307 struct _reent * p = ImpurePtr2(); |
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308 User::LeaveIfNull(p); |
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309 CloseSTDLIB(); |
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310 } |
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311 |
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312 /** |
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313 @SYMTestCaseID SYSLIB-STDLIB-UT-4002 |
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314 @SYMTestCaseDesc Test checks the constructor of CLocalSystemInterface does not panics in OOM test |
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315 or when error KErrNoMemory occurs. |
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316 @SYMTestPriority Normal |
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317 @SYMTestActions In an OOM test, repeats calling ImpurePtr2(), which creates CLocalSystemInterface instance. |
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318 @SYMTestExpectedResults The test program should not panic or fail. |
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319 @SYMDEF DEF114383 |
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320 */ |
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321 LOCAL_C void Defect_DEF114383() |
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322 { |
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323 TheTest.Next(_L(" @SYMTestCaseID:SYSLIB-STDLIB-UT-4002 DEF114383: STDLIB, CLocalSystemInterface::CLocalSystemInterface() panics in OOM ")); |
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324 |
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325 TInt err=KErrNone; |
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326 TInt tryCount = 0; |
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327 do |
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328 { |
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329 __UHEAP_MARK; |
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330 |
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331 __UHEAP_SETFAIL(RHeap::EDeterministic, ++tryCount); |
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332 TRAP(err, TestImpurePtrL()); |
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333 __UHEAP_SETFAIL(RHeap::ENone, 0); |
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334 |
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335 if (err!=KErrNoMemory) |
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336 TEST(err == KErrNone); |
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337 |
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338 __UHEAP_MARKEND; |
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339 } while(err == KErrNoMemory); |
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340 |
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341 TEST(err == KErrNone); |
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342 |
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343 TheTest.Printf(_L("- ImpurePtr2() succeeded at heap failure rate of %i\n"), tryCount); |
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344 } |
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345 |
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346 /** |
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347 Invoke the tests |
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348 */ |
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349 LOCAL_C void RunTestsL () |
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350 { |
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351 Defect_DEF062679_memcpy(); |
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352 Defect_DEF062679_memcmp(); |
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353 |
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354 Defect_INC073740(); |
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355 |
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356 Defect_PDEF091928(); |
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357 |
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358 Defect_DEF110593(); |
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359 |
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360 Defect_PDEF114447(); |
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361 |
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362 Defect_DEF114383(); |
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363 } |
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364 |
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365 |
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366 |
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367 GLDEF_C TInt E32Main() |
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368 { |
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369 |
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370 CTrapCleanup* tc = CTrapCleanup::New(); |
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371 TEST(tc != NULL); |
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372 |
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373 __UHEAP_MARK; |
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374 |
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375 TheTest.Title(); |
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376 TheTest.Start (_L("Defect Tests")); |
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377 TInt err; |
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378 TRAP(err, ::RunTestsL()) |
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379 TEST2(err, KErrNone); |
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380 |
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381 TheTest.End(); |
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382 TheTest.Close(); |
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383 |
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384 delete tc; |
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385 __UHEAP_MARKEND; |
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386 |
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387 |
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388 |
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389 return(KErrNone); |
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390 |
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391 } |
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392 |