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1 // Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies). |
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2 // All rights reserved. |
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3 // This component and the accompanying materials are made available |
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4 // under the terms of "Eclipse Public License v1.0" |
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5 // which accompanies this distribution, and is available |
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6 // at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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7 // |
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8 // Initial Contributors: |
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9 // Nokia Corporation - initial contribution. |
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10 // |
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11 // Contributors: |
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12 // |
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13 // Description: |
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14 // t_main |
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15 // Main test harness for t_tinternetdate |
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16 // |
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17 // |
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18 |
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19 |
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20 |
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21 // MEMORY LEAK TESTING - Change and recompile to enable memory leak testing |
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22 // #define __MEMORY_LEAK_TESTING_ENABLED |
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23 |
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24 |
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25 |
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26 #include <e32base.h> |
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27 #include "IpuTestUtils.h" |
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28 |
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29 #include "cconverttorfc1123formtest.h" |
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30 |
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31 _LIT(KTestPanic, "TInetDate"); |
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32 _LIT(KTestTitle, "T_TInternetDate"); |
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33 |
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34 GLDEF_C void Panic(TInt aPanic); |
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35 |
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36 |
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37 GLDEF_C void Panic(TInt aPanic) |
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38 { |
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39 User::Panic(KTestPanic,aPanic); |
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40 } |
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41 |
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42 GLDEF_C void TestL() |
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43 { |
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44 CIpuTestHarness* testHarness = CIpuTestHarness::NewL(KTestTitle); |
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45 CleanupStack::PushL(testHarness); |
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46 testHarness->DoResourceLeakTest(ETrue); |
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47 |
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48 testHarness->LogIt(_L ("@SYMTestCaseID IWS-APPPROTOCOLS-INETPROTUTIL-T_TINTERNETDATE-0001 ")); |
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49 |
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50 CConvertToRfc1123FormTest* convertToRfc1123FormTest = CConvertToRfc1123FormTest::NewLC(testHarness); |
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51 #ifdef __MEMORY_LEAK_TESTING_ENABLED |
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52 CTestBase::MemoryLeakTestL(*convertToRfc1123FormTest,*testHarness); |
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53 #endif |
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54 convertToRfc1123FormTest->DoTestsL(); |
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55 |
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56 CleanupStack::PopAndDestroy(2, testHarness); |
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57 } |
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58 |
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59 GLDEF_C TInt E32Main() |
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60 // |
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61 // Main function |
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62 { |
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63 __UHEAP_MARK; |
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64 CTrapCleanup* tc=CTrapCleanup::New(); |
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65 TRAPD(err,TestL()); |
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66 if (err!=KErrNone) |
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67 User::Panic(_L("Test Fail"),err); |
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68 delete tc; |
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69 __UHEAP_MARKEND; |
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70 return KErrNone; |
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71 } |
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72 |