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1 // Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies). |
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2 // All rights reserved. |
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3 // This component and the accompanying materials are made available |
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4 // under the terms of "Eclipse Public License v1.0" |
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5 // which accompanies this distribution, and is available |
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6 // at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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7 // |
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8 // Initial Contributors: |
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9 // Nokia Corporation - initial contribution. |
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10 // |
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11 // Contributors: |
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12 // |
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13 // Description: |
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14 // For testing Persist HAL : |
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15 // |
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16 // |
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17 |
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18 /** |
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19 @file |
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20 @internalComponent |
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21 @test |
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22 */ |
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23 |
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24 #include <e32base.h> |
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25 #include <hal.h> |
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26 #include <bautils.h> |
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27 #include <e32test.h> |
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28 |
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29 #define TEST(arg) ::Check((arg), __LINE__) |
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30 #define TEST2(aValue, aExpected) ::Check(aValue, aExpected, __LINE__) |
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31 |
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32 LOCAL_D RTest TheTest (_L ("T_PersistHAL")); |
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33 |
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34 TInt noSample = 25; |
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35 |
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36 LOCAL_C void Check(TInt aValue, TInt aLine) |
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37 { |
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38 if(!aValue) |
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39 { |
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40 TheTest(EFalse, aLine); |
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41 } |
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42 } |
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43 |
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44 LOCAL_C void Check(TInt aValue, TInt aExpected, TInt aLine) |
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45 { |
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46 if(aValue != aExpected) |
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47 { |
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48 RDebug::Print(_L("*** Expected error: %d, got: %d\r\n"), aExpected, aValue); |
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49 TheTest(EFalse, aLine); |
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50 } |
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51 } |
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52 |
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53 TInt TestPersistHALWaitDirectL() |
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54 { |
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55 RProcess process; |
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56 TEST2(process.Create(_L("HALSettings.exe"), _L("PERSIST")),KErrNone); |
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57 TRequestStatus status; |
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58 process.Logon(status); |
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59 process.Resume(); |
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60 User::WaitForRequest(status); |
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61 TInt exitReason = process.ExitReason(); |
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62 process.Close(); |
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63 return exitReason; |
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64 } |
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65 |
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66 //Tests |
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67 //==================================================================== |
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68 |
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69 /** |
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70 @SYMTestCaseID SYSLIB-HALSETTINGS-CT-1721 |
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71 @SYMTestCaseDesc Performance Test Persist HAL |
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72 @SYMTestPriority Medium |
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73 @SYMTestActions This test trys to persist HAL settings by starting HALSetting.exe |
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74 directly |
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75 @SYMTestExpectedResults Tests must not fail |
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76 @SYMDEF DEF083235: Prop: HAL Attributes (eg screen calibration) lost if the battery is pulled out |
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77 */ |
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78 void TestPerformancePersistDirectL() |
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79 { |
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80 TheTest.Next (_L (" @SYMTestCaseID:SYSLIB-HALSETTINGS-CT-1721 Performance Persist test directly calling EXE ")); |
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81 TInt fastTimerFreq; |
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82 HAL::Get(HALData::EFastCounterFrequency, fastTimerFreq); |
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83 TReal ticksPerMicroSec = 1.0E-6 * fastTimerFreq; |
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84 |
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85 TUint prevTime; |
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86 TUint timeDiff; |
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87 |
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88 prevTime = User::FastCounter(); |
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89 TInt noSuccessfulSamples=0; |
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90 for(; noSuccessfulSamples < noSample; ++noSuccessfulSamples) |
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91 { |
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92 if(TestPersistHALWaitDirectL() !=KErrNone ) |
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93 { |
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94 break;//Stop performing the tests, calculate average with no of successful Samples. |
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95 } |
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96 } |
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97 TEST(noSuccessfulSamples >0); |
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98 timeDiff = User::FastCounter() - prevTime; |
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99 TReal64 fsSessionMicroSecs = timeDiff / (noSuccessfulSamples * ticksPerMicroSec); |
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100 TheTest.Printf(_L("Time to Persist HAL directly calling exe = %10.2lf microseconds\n"), fsSessionMicroSecs); |
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101 } |
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102 |
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103 /** |
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104 @SYMTestCaseID SYSLIB-HALSETTINGS-CT-1722 |
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105 @SYMTestCaseDesc Performance Test Persist HAL through BAFL DLL |
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106 @SYMTestPriority Medium |
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107 @SYMTestActions This test trys to persist HAL settings by calling BAFL |
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108 API |
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109 @SYMTestExpectedResults Tests must not fail |
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110 @SYMDEF DEF083235: Prop: HAL Attributes (eg screen calibration) lost if the battery is pulled out |
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111 */ |
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112 void TestPerformancePersistThroughBAFL() |
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113 { |
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114 |
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115 TheTest.Next (_L (" @SYMTestCaseID:SYSLIB-HALSETTINGS-CT-1722 Performance Persist test Through BAFL DLL ")); |
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116 TInt fastTimerFreq; |
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117 HAL::Get(HALData::EFastCounterFrequency, fastTimerFreq); |
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118 TReal ticksPerMicroSec = 1.0E-6 * fastTimerFreq; |
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119 |
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120 TUint prevTime; |
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121 TUint timeDiff; |
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122 |
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123 prevTime = User::FastCounter(); |
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124 TInt noSuccessfulSamples=0; |
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125 for(;noSuccessfulSamples< noSample; ++noSuccessfulSamples) |
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126 { |
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127 if(BaflUtils::PersistHAL()!=KErrNone) |
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128 { |
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129 break;//Stop performing the tests, calculate average with no of successful Samples. |
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130 } |
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131 } |
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132 TEST(noSuccessfulSamples >0); |
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133 timeDiff = User::FastCounter() - prevTime; |
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134 TReal64 fsSessionMicroSecs = timeDiff / (noSuccessfulSamples * ticksPerMicroSec); |
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135 TheTest.Printf(_L("Time to Persist HAL through BAFL DLL = %10.2lf microseconds\n"), fsSessionMicroSecs); |
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136 } |
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137 |
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138 /** |
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139 @SYMTestCaseID SYSLIB-HALSETTINGS-CT-1723 |
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140 @SYMTestCaseDesc Capability Test |
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141 @SYMTestPriority Medium |
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142 @SYMTestActions This test exe do not have the capability to initialise HAL settings |
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143 try to initialise HAL setting by starting HALSetting.exe |
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144 @SYMTestExpectedResults Tests must not fail |
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145 @SYMDEF DEF083235: Prop: HAL Attributes (eg screen calibration) lost if the battery is pulled out |
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146 */ |
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147 void CapabilityTest() |
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148 { |
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149 TheTest.Next (_L (" @SYMTestCaseID:SYSLIB-HALSETTINGS-CT-1723 Capability Test ")); |
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150 RProcess process; |
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151 //To initialise processes should have SID == SID of EStart, This process's SID is '0' |
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152 TEST2(process.Create(_L("HALSettings.exe"), _L("INITIALISE")),KErrNone); |
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153 TRequestStatus status; |
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154 process.Logon(status); |
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155 process.Resume(); |
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156 User::WaitForRequest(status); |
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157 TInt exitReason = process.ExitReason(); |
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158 process.Close(); |
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159 TEST2(exitReason,KErrPermissionDenied); |
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160 } |
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161 |
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162 LOCAL_C void RunTestsL() |
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163 { |
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164 TEST2(TestPersistHALWaitDirectL (),KErrNone); |
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165 TEST2(BaflUtils::PersistHAL(),KErrNone); |
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166 |
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167 CapabilityTest(); |
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168 TestPerformancePersistDirectL (); |
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169 TestPerformancePersistThroughBAFL (); |
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170 } |
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171 |
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172 GLDEF_C TInt E32Main() |
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173 { |
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174 __UHEAP_MARK; |
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175 TheTest.Title (); |
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176 TheTest.Start (_L ("HAL Persist test")); |
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177 CTrapCleanup* tc = CTrapCleanup::New(); |
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178 |
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179 TRAPD(err, ::RunTestsL()); |
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180 |
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181 delete tc; |
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182 TheTest.End (); |
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183 TheTest.Close (); |
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184 __UHEAP_MARKEND; |
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185 return err; |
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186 } |