lowlevellibsandfws/apputils/tsrc/T_CLINE.CPP
changeset 0 e4d67989cc36
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/lowlevellibsandfws/apputils/tsrc/T_CLINE.CPP	Tue Feb 02 02:01:42 2010 +0200
@@ -0,0 +1,53 @@
+// Copyright (c) 1997-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+#include <e32cons.h>
+#include <bacline.h>
+
+CConsoleBase* console;
+
+void WriteArgsL()
+	{
+	CCommandLineArguments* args=CCommandLineArguments::NewLC();
+	for (TInt i=0; i<args->Count(); i++)
+		{
+		TPtrC argumentPrt(args->Arg(i));
+		console->Printf(_L("arg %d == %S\n"), i, &argumentPrt);
+		}
+	CleanupStack::PopAndDestroy();
+	}
+
+void TestReaderL()
+	{
+	console=Console::NewL(_L("Command-line arguments reader test"),TSize(KConsFullScreen, KConsFullScreen));
+	CleanupStack::PushL(console);
+	WriteArgsL();
+	//The following two lines were removed to support the automated test for T_CLINEPARENT
+	//console->Printf(_L("Press any key to exit:"));
+	//console->Getch();
+	CleanupStack::PopAndDestroy(console);
+	}
+
+GLDEF_C TInt E32Main()
+    {
+	__UHEAP_MARK; // mark heap state
+	CTrapCleanup* cleanup=CTrapCleanup::New(); // get clean-up stack
+	TRAPD(error,TestReaderL()); // do most stuff under cleanup stack
+	__ASSERT_ALWAYS(!error,User::Invariant());
+	delete cleanup; // destroy clean-up stack
+	__UHEAP_MARKEND; // check no memory leak
+	return 0; // and return
+    }
+