diff -r e20de85af2ee -r ce057bb09d0b genericservices/httputils/Test/t_tinternetdate/t_main.cpp
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/genericservices/httputils/Test/t_tinternetdate/t_main.cpp	Fri Jun 04 16:20:51 2010 +0100
@@ -0,0 +1,72 @@
+// Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+// t_main
+// Main test harness for t_tinternetdate
+// 
+//
+
+
+
+// MEMORY LEAK TESTING - Change and recompile to enable memory leak testing
+// #define __MEMORY_LEAK_TESTING_ENABLED
+
+
+
+#include <e32base.h>
+#include "IpuTestUtils.h"
+
+#include "cconverttorfc1123formtest.h"
+
+_LIT(KTestPanic, "TInetDate");
+_LIT(KTestTitle, "T_TInternetDate");
+
+GLDEF_C void Panic(TInt aPanic);
+
+
+GLDEF_C void Panic(TInt aPanic)
+	{
+	User::Panic(KTestPanic,aPanic);
+	}
+
+GLDEF_C void TestL()
+	{
+	CIpuTestHarness* testHarness = CIpuTestHarness::NewL(KTestTitle);
+	CleanupStack::PushL(testHarness);
+	testHarness->DoResourceLeakTest(ETrue);
+
+	testHarness->LogIt(_L ("@SYMTestCaseID IWS-APPPROTOCOLS-INETPROTUTIL-T_TINTERNETDATE-0001 "));
+
+	CConvertToRfc1123FormTest* convertToRfc1123FormTest = CConvertToRfc1123FormTest::NewLC(testHarness);
+#ifdef __MEMORY_LEAK_TESTING_ENABLED
+	CTestBase::MemoryLeakTestL(*convertToRfc1123FormTest,*testHarness);
+#endif
+	convertToRfc1123FormTest->DoTestsL();
+
+	CleanupStack::PopAndDestroy(2, testHarness);
+	}
+
+GLDEF_C TInt E32Main()
+//
+// Main function
+	{
+	__UHEAP_MARK;
+	CTrapCleanup* tc=CTrapCleanup::New();
+	TRAPD(err,TestL());
+	if (err!=KErrNone)
+		User::Panic(_L("Test Fail"),err);
+	delete tc;
+	__UHEAP_MARKEND;
+	return KErrNone;
+	}
+