diff -r 000000000000 -r e4d67989cc36 lowlevellibsandfws/pluginfw/TestExecute/EComPerfTest/src/TE_EcomGranularityTestStep.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/lowlevellibsandfws/pluginfw/TestExecute/EComPerfTest/src/TE_EcomGranularityTestStep.h	Tue Feb 02 02:01:42 2010 +0200
@@ -0,0 +1,53 @@
+// Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @internalComponent
+*/
+ 
+#ifndef	TE_ECOMGRANULARITYTESTSTEP_H
+#define	TE_ECOMGRANULARITYTESTSTEP_H
+
+#include <test/testexecutestepbase.h>
+
+_LIT(KEComImplIndexPerfTest, "EComImplIndexPerfTest");
+        
+/** 
+Teststep to measure ECOM discovery time at critical static stage
+at various settings of granularities of ECOM's implementation
+RArray.
+*/
+class CEComImplIndexPerfTest : public CTestStep
+	{
+public:
+	CEComImplIndexPerfTest();
+	~CEComImplIndexPerfTest();
+	TVerdict doTestStepL();
+
+private:
+	TVerdict ReadConfigParameters();
+
+private:
+	TInt iMinInfUidIndexGranularity;
+	TInt iMinIimplUidIndexGranularity;
+	TInt iMaxInfUidIndexGranularity;
+	TInt iMaxIimplUidIndexGranularity;
+	TInt iGranStep;
+	CActiveScheduler* iScheduler;
+	RFs iFs;
+	};
+	
+#endif //TE_ECOMGRANULARITYTESTSTEP_H