symbianunittestfw/sutfw/inc/symbianunittestrunner.h
changeset 0 20abbd395761
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/symbianunittestfw/sutfw/inc/symbianunittestrunner.h	Wed Aug 25 15:52:14 2010 +0300
@@ -0,0 +1,94 @@
+/*
+* Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description:  
+*
+*/
+
+#ifndef SYMBIANUNITTESTRUNNER_H
+#define SYMBIANUNITTESTRUNNER_H
+
+// INCLUDES
+#include "symbianunittestobserver.h"
+#include <symbianunittestinterface.h>
+#include <badesca.h>
+#include <e32base.h>
+
+// FORWARD DECLARATIONS
+class MSymbianUnitTestInterface;
+class CSymbianUnitTestResult;
+class MSymbianUnitTestUiCallBack;
+
+const TInt KSymbianUnitTestDefaultTimeout = 30;
+
+// CLASS DECLARATION
+class CSymbianUnitTestRunner : public CBase, public MSymbianUnitTestObserver
+    {
+    public: // Constructors and destructor
+    
+        IMPORT_C static CSymbianUnitTestRunner* NewLC(
+            MSymbianUnitTestUiCallBack& aUiCallBack );
+    
+        IMPORT_C static CSymbianUnitTestRunner* NewL(
+            MSymbianUnitTestUiCallBack& aUiCallBack );
+    
+        IMPORT_C ~CSymbianUnitTestRunner();
+    
+    public: // From MSymbianUnitTestObserver
+           
+        void TestPass(const TDesC& aTestCaseName);
+        void TestFailed(const TDesC& aTestCaseName, const TDesC8& aErrMsg);
+        
+    public: // New functions
+        
+        IMPORT_C TInt TestCount();
+        
+        IMPORT_C void ExecuteTestsL( 
+            const MDesCArray& aTestDllNames,
+            TBool aMemoryAllocationFailureSimulation,
+            const TDesC& aOutputFileName,
+            const TDesC& aOutputFormat,
+	    const CDesCArray& aTestCaseNames, 
+	    TInt aTimeout = KSymbianUnitTestDefaultTimeout );
+        
+        IMPORT_C TInt FailedTestCount();
+        
+        IMPORT_C void TestCaseNamesL(const TDesC& aTestDllName, CDesCArray& aTestCaseNames);
+        
+        IMPORT_C TInt TestCountL(const MDesCArray& aTestDllNames, const MDesCArray& aTestCaseNames);
+    
+    private: // Constructors
+    
+        CSymbianUnitTestRunner( MSymbianUnitTestUiCallBack& aUiCallBack );
+        void ConstructL();
+    
+    private: // New functions
+        
+        static void DeleteTest( TAny* aTest );
+        void ExecuteDllTestsL(const TDesC& aTestDllName, MSymbianUnitTestInterface::TFailureSimulation aFailureSimulation, 
+                const CDesCArray& aTestCaseNames,
+                TInt  aTimeout);
+        void ExecuteLddTestsL(const TDesC& aTestLddName, const CDesCArray& aTestCaseNames,
+                TInt  aTimeout);
+        
+        void GetDllTestCaseNamesL(const TDesC& aTestDllName, CDesCArray& aTestCaseNames); 
+        void GetLddTestCaseNamesL(const TDesC& aTestDllName, CDesCArray& aTestCaseNames);
+        
+    private: // Data
+        
+        MSymbianUnitTestUiCallBack& iUiCallBack;
+        CSymbianUnitTestResult* iResult;
+        TInt iTestCount;
+    };
+
+#endif // SYMBIANUNITTESTRUNNER_H