symbianunittestfw/sutfw/sutfwcore/sutfwframework/tsrc/inc/ut_symbianunittestresult.h
--- /dev/null Thu Jan 01 00:00:00 1970 +0000
+++ b/symbianunittestfw/sutfw/sutfwcore/sutfwframework/tsrc/inc/ut_symbianunittestresult.h Wed Aug 25 15:52:14 2010 +0300
@@ -0,0 +1,60 @@
+/*
+* Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description:
+*
+*/
+
+#ifndef UT_SYMBIANUNITTESTRESULT_H
+#define UT_SYMBIANUNITTESTRESULT_H
+
+// INCLUDES
+#include <symbianunittest.h>
+
+// FORWARD DECLARATIONS
+class CSymbianUnitTestResult;
+
+// CLASS DECLARATION
+NONSHARABLE_CLASS( UT_CSymbianUnitTestResult ) : public CSymbianUnitTest
+ {
+ public: // Constructors and destructor
+
+ static UT_CSymbianUnitTestResult* NewL();
+ static UT_CSymbianUnitTestResult* NewLC();
+ ~UT_CSymbianUnitTestResult();
+
+ protected: // Test functions
+
+ void SetupL();
+ void Teardown();
+ void UT_TestCountL();
+ void UT_StartTestL();
+ void UT_AddFailureL();
+ void UT_AddSetupErrorL();
+ void UT_AddLeaveFromTestL();
+ void UT_AddAssertFailureL();
+ void UT_AddMemoryLeakInfoL();
+ void UT_AddPanicInfoL();
+ void UT_AddTimeOutErrorL();
+
+ private: // Contructors
+
+ UT_CSymbianUnitTestResult();
+ void ConstructL();
+
+ private: // Data
+
+ CSymbianUnitTestResult* iUnitTestResult;
+ };
+
+#endif // UT_SYMBIANUNITTESTRESULT_H