--- a/testexecmdw/tef/tef/tefunit/test/inc/ctestsuited.h	Fri Sep 03 07:55:01 2010 +0300
+++ /dev/null	Thu Jan 01 00:00:00 1970 +0000
@@ -1,44 +0,0 @@
-/*
-* Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
-* All rights reserved.
-* This component and the accompanying materials are made available
-* under the terms of "Eclipse Public License v1.0"
-* which accompanies this distribution, and is available
-* at the URL "http://www.eclipse.org/legal/epl-v10.html".
-*
-* Initial Contributors:
-* Nokia Corporation - initial contribution.
-*
-* Contributors:
-*
-* Description: 
-*
-*/
-
-
-
-/**
- @file CTestSuiteD.h
-*/
-
-#ifndef __TEST_SUITE_D__
-#define __TEST_SUITE_D__
-
-#include "tefunit.h"
-
-class CTestSuiteD : public CTestFixture 
-	{
-public:
-	// SetUp and TearDown code 
-	virtual void SetupL();
-	virtual void TearDownL();
-
-	// Tests
-	void TestOne();
-	void TestTwo();
-
-	// Create a suite of all the tests
-	static CTestSuite* CreateSuiteL(const TDesC& aName);
-	};
-
-#endif // __TEST_SUITE_D__