// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

/**

 @file

 @test

 @internalComponent - Internal Symbian test code 

*/

#ifndef __EFMTESTSTEPBASE__

#define __EFMTESTSTEPBASE__

#include <test/testexecutestepbase.h>

#include "efm_test_consts.h"

/*

test type section name 

test type section indicates whether the test step is performed in normal 

or low capabilty environment

*/

_LIT(KTestLowCap, "testlowcap");

_LIT(KTestOOM, "testOOM");

//macros used for testing

#define TESTDIAGNOSTIC(cond,message)\

   if (!(cond))\

   {\

   ERR_PRINTF1( message);\

   SetTestStepResult(EFail);\

   }

#define TESTDIAGNOSTICERROR(cond,message,error)\

   if (!(cond))\

   {\

   ERR_PRINTF2( message, error );\

   SetTestStepResult(EFail);\

   }   

/** Test step that publishes features required by the rest of test steps

*/

_LIT(KEFMTestStepPublishFeatures, "EFMTestStepPublishFeatures");

class CEFMTestStepPublishFeatures : public CTestStep

   {

public:

   CEFMTestStepPublishFeatures();

   virtual TVerdict doTestStepL(void);

   };

/** Base class for configurable test steps

*/

class CEFMConfigurableTestStepBase : public CTestStep

   {

public:

   	virtual TVerdict doTestStepPreambleL(void);   

protected:

	virtual void CheckCondition(TBool aMainCondition, TBool aOOMCondition, TPtrC aLoggingMessage, TInt aErrorCode);

   TBool iLowCap;

   TBool iOOM;

   };    

#endif