diff -r 21625e5de155 -r 93c0009bd947 usbmgmt/usbmgrtest/t_usb_charging/src/testbase.cpp
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/usbmgmt/usbmgrtest/t_usb_charging/src/testbase.cpp	Thu Sep 16 12:03:29 2010 +0800
@@ -0,0 +1,49 @@
+/*
+* Copyright (c) 2006-2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description:
+*
+*/
+
+#include "testbase.h"
+#include "testmanager.h"
+#include "OstTraceDefinitions.h"
+#ifdef OST_TRACE_COMPILER_IN_USE
+#include "testbaseTraces.h"
+#endif
+
+
+CTestBase::CTestBase(MTestManager& aManager)
+ :	iManager(aManager)
+	{
+	OstTraceFunctionEntry0( CTESTBASE_CTESTBASE_ENTRY );
+	OstTraceFunctionExit0( CTESTBASE_CTESTBASE_EXIT );
+	}
+
+CTestBase::~CTestBase()
+	{
+	OstTraceFunctionEntry0( DUP1_CTESTBASE_CTESTBASE_ENTRY );
+	OstTraceFunctionExit0( DUP1_CTESTBASE_CTESTBASE_EXIT );
+	}
+
+void CTestBase::ProcessKeyL(TKeyCode /*aKeyCode*/)
+	{
+	OstTraceFunctionEntry0( CTESTBASE_PROCESSKEYL_ENTRY );
+	OstTraceFunctionExit0( CTESTBASE_PROCESSKEYL_EXIT );
+	}
+
+void CTestBase::ProcessKeyL(const TDesC8& /*aString*/)
+	{
+	OstTraceFunctionEntry0( DUP1_CTESTBASE_PROCESSKEYL_ENTRY );
+	OstTraceFunctionExit0( DUP1_CTESTBASE_PROCESSKEYL_EXIT );
+	}