diff -r 000000000000 -r 3e07fef1e154 testexecfw/symbianunittestfw/sutfw/sutfwcore/sutfwframework/tsrc/inc/ut_symbianunittestresult.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/testexecfw/symbianunittestfw/sutfw/sutfwcore/sutfwframework/tsrc/inc/ut_symbianunittestresult.h	Mon Mar 08 15:03:44 2010 +0800
@@ -0,0 +1,60 @@
+/*
+* Copyright (c) 2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description:  
+*
+*/
+
+#ifndef UT_SYMBIANUNITTESTRESULT_H
+#define UT_SYMBIANUNITTESTRESULT_H
+
+// INCLUDES
+#include <symbianunittest.h>
+
+// FORWARD DECLARATIONS
+class CSymbianUnitTestResult;
+
+// CLASS DECLARATION
+class UT_CSymbianUnitTestResult : public CSymbianUnitTest
+    {
+    public: // Constructors and destructor
+    
+        static UT_CSymbianUnitTestResult* NewL();
+        static UT_CSymbianUnitTestResult* NewLC();
+        ~UT_CSymbianUnitTestResult();
+    
+    protected: // Test functions
+    
+        void SetupL();
+        void Teardown();       
+        void UT_TestCountL();
+        void UT_StartTestL();
+        void UT_AddFailureL();
+        void UT_AddSetupErrorL();        
+        void UT_AddLeaveFromTestL();       
+        void UT_AddAssertFailureL();
+        void UT_AddMemoryLeakInfoL();
+        void UT_AddPanicInfoL();        
+	void UT_AddTimeOutErrorL();
+
+    private: // Contructors
+        
+        UT_CSymbianUnitTestResult();
+        void ConstructL();        
+        
+    private: // Data
+    
+        CSymbianUnitTestResult* iUnitTestResult;
+    };
+
+#endif // UT_SYMBIANUNITTESTRESULT_H