diff -r 000000000000 -r 3e07fef1e154 testexecfw/tef/tefunit/test/inc/ctestsuited.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/testexecfw/tef/tefunit/test/inc/ctestsuited.h	Mon Mar 08 15:03:44 2010 +0800
@@ -0,0 +1,44 @@
+/*
+* Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description: 
+*
+*/
+
+
+
+/**
+ @file CTestSuiteD.h
+*/
+
+#ifndef __TEST_SUITE_D__
+#define __TEST_SUITE_D__
+
+#include "TEFUnit.h"
+
+class CTestSuiteD : public CTestFixture 
+	{
+public:
+	// SetUp and TearDown code 
+	virtual void SetupL();
+	virtual void TearDownL();
+
+	// Tests
+	void TestOne();
+	void TestTwo();
+
+	// Create a suite of all the tests
+	static CTestSuite* CreateSuiteL(const TDesC& aName);
+	};
+
+#endif // __TEST_SUITE_D__