diff -r bbd31066657e -r 8bb370ba6d1d testexecfw/stf/stfext/testmodules/teftestmod/teftestmodulefw/tefunit/inc/crunner.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/testexecfw/stf/stfext/testmodules/teftestmod/teftestmodulefw/tefunit/inc/crunner.h	Fri Apr 09 10:46:28 2010 +0800
@@ -0,0 +1,64 @@
+/*
+* Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description: 
+*
+*/
+
+
+
+/**
+ @file CRunner.h
+*/
+
+#ifndef __RUNNER__
+#define __RUNNER__
+
+#include <e32base.h>
+
+#include "tefunit.h"
+
+class CPath
+	{
+public:
+	CPath();
+	void ConstructL( const TDes& aPath);
+	static CPath* NewL( TDes& aPath );
+	~CPath();
+	TTestName Current() const;
+	TTestName NextL();
+	TInt Count() const;
+	TInt Remaining() const;
+
+private:
+	RArray<TTestName>	iFields;
+	TInt				iCurrent;
+	};
+
+class CRunner : public CBase, public MVisitor
+	{
+public: 
+	CRunner( const CTestConfig& aConfig, const CTestExecuteLogger& aLogger);
+	virtual ~CRunner();
+	void ConstructL( const TTestPath& aPath );
+	static CRunner* NewL( const TTestPath &aPath, const CTestConfig& aConfig, const CTestExecuteLogger& aLogger );
+	virtual void VisitL(CTestCase* aTestCase);
+	virtual void VisitL(CTestSuite* aTestSuite);
+private:
+	CPath				iPath;
+	CTestConfig			iConfig;
+	CTestExecuteLogger	iLogger;
+	};
+
+#endif // __RUNNER__
+