--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/installationservices/swcomponentregistry/test/tscrdatalayer/inc/datalayersteps.h	Tue Aug 31 15:21:33 2010 +0300
@@ -0,0 +1,54 @@
+/*
+* Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of the License "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description: 
+* Defines the unit test steps for the SCR Data Layer.
+*
+*/
+
+
+/**
+ @file 
+ @internalComponent
+ @test
+*/
+
+#ifndef TSCRDATALAYER_H
+#define TSCRDATALAYER_H
+
+#include "scrdatabase.h"
+#include "tscrdatalayerserver.h"
+
+#include <scs/oomteststep.h>
+using namespace Usif;
+
+// Constant used to name this test case
+_LIT(KScrDataLayerStep,"SCRDataLayer");
+
+class CScrTestDataLayer : public COomTestStep
+	{
+public:
+	CScrTestDataLayer(CScrDataLayerTestServer& aParent);
+	~CScrTestDataLayer();
+	void ImplTestStepPreambleL();
+	void ImplTestStepL();
+	void ImplTestStepPostambleL();
+	
+private:
+    void InsertRecordL(CStatement& aStmt, TInt aCol1, const TDesC& aCol2, const TDesC& aCol3);
+	void VerifyRecordL(CStatement& aStmt, TInt aCol1, const TDesC& aCol2, const TDesC& aCol3);
+	void ExecuteBadStatementL(CDatabase &aDb, TInt aTestNum, const TDesC& aStatement);
+	void PrintErrorL(const TDesC& aMsg, TInt aErrNum,...);
+	};
+
+#endif /* TSCRDATALAYER_H */