/*

* Copyright (c) 2002-2007 Nokia Corporation and/or its subsidiary(-ies).

* All rights reserved.

* This component and the accompanying materials are made available

* under the terms of "Eclipse Public License v1.0"

* which accompanies this distribution, and is available

* at the URL "http://www.eclipse.org/legal/epl-v10.html".

*

* Initial Contributors:

* Nokia Corporation - initial contribution.

*

* Contributors:

*

* Description:  FSQ Test DLL

*

*/

#ifndef __CPPUNIT_TESTRESULT_H

#define __CPPUNIT_TESTRESULT_H

#include <e32base.h>

class MTest;

class CAssertFailure;

class CTestFailure;

/*

 * A CTestResult collects the results of executing a test case. It is an 

 * instance of the Collecting Parameter pattern.

 *

 * The test framework distinguishes between failures and errors.

 * A failure is anticipated and checked for with assertions. Errors are

 * unanticipated problems that are caused by "leaves" that are not generated

 * by the framework.

 *

 * see MTest

 */

class CTestResult : public CBase

	{

public:

	IMPORT_C static CTestResult* NewLC();

	IMPORT_C static CTestResult* NewL();

    IMPORT_C ~CTestResult ();

    IMPORT_C TInt TestCount ();

    IMPORT_C RPointerArray<CTestFailure>& Errors ();

    IMPORT_C RPointerArray<CTestFailure>& Failures ();

    IMPORT_C TBool WasSuccessful ();

	void IncrementTestCount ();

    void AddErrorL (MTest& aTest, TInt aError);

    void AddFailureL (MTest& aTest, CAssertFailure* aAssertFailure);

private:

	void ConstructL ();

	CTestResult ();

    RPointerArray<CTestFailure> iErrors;

    RPointerArray<CTestFailure> iFailures;

	TInt iTestCount; 

	};

#endif