// Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

//

#include <ineturilistdef.h>

#include <s32mem.h>

#include <s32buf.h>

#include "testutils.h"

#include <ineturilist.h>

#include "tineturilisttester.h"

_LIT(KTitle, "InetUriList Dll Tests");

LOCAL_D RTest gTest( KTitle() );

LOCAL_D CTestWrapper* gTestWrapper;

LOCAL_C void RunTestsL ( TBool aNormalRun = ETrue )

	{	

	CInetUriListTester* listTester = CInetUriListTester::NewL ( *gTestWrapper );

	CleanupStack::PushL ( listTester );

	listTester->TestL (aNormalRun);

	listTester->DoListCleanupL ();

	CleanupStack::PopAndDestroy (); // listTester

	}

LOCAL_C void RunOoomTestsL ()

	{

	gTestWrapper->Next(_L("@SYMTestCaseID IWS-APPPROTOCOLS-INETURILIST-LIST-0001 [Inet Uri List tests] OOM testing"));

	TRAPD( ret, RunTestsL(EFalse) );

	gTestWrapper->TESTE( ret==KErrNone, ret );

	}

LOCAL_C void DoTestsL ()

	{	

	gTestWrapper = CTestWrapper::NewLC(gTest);

	gTestWrapper->Start(_L("test"));

	TRAPD ( err, RunTestsL () );

	gTestWrapper->TESTE( err==KErrNone, err );	

	TRAP ( err, RunOoomTestsL () );

	gTestWrapper->TESTE( err==KErrNone, err );	

	gTestWrapper->End();

	CleanupStack::PopAndDestroy(gTestWrapper);

	}

GLDEF_C TInt E32Main()

	{

	__UHEAP_MARK;

	CTrapCleanup* tc = CTrapCleanup::New();

	TRAPD( err, DoTestsL() );

	if ( err != KErrNone )

		User::Panic( _L( "Test failed with error code: %i" ), err );

	delete tc;

	__UHEAP_MARKEND;

	return KErrNone;

	}