1 // Copyright (c) 2002-2009 Nokia Corporation and/or its subsidiary(-ies).

     2 // All rights reserved.

     3 // This component and the accompanying materials are made available

     4 // under the terms of "Eclipse Public License v1.0"

     5 // which accompanies this distribution, and is available

     6 // at the URL "http://www.eclipse.org/legal/epl-v10.html".

     7 //

     8 // Initial Contributors:

     9 // Nokia Corporation - initial contribution.

    10 //

    11 // Contributors:

    12 //

    13 // Description:

    14 //

    15 

    16 /**

    17  @file TestOom.h

    18 */

    19 

    20 #ifndef	__TESTOOM_H__

    21 #define __TESTOOM_H__

    22 

    23 // System includes

    24 #include <e32std.h>

    25 

    26 

    27 // Testing macro, used as a wrapper to calls made to the WAP Stack.

    28 // The macro simulates allocation failures in the WAP Stack, and returns

    29 // KErrNoMemory in OOM situations when used in a heap-failure testing environment.

    30 // Also define the test-leave macro, which should be place before calls to leaving functions

    31 // in order to simulate the control paths followed should their leaves occur.

    32 #if defined (_DEBUG) && defined(__UNIT_TESTING__)

    33 

    34 #define __TESTOOM(_r, _x) _r = KErrNone;{HBufC* _a=HBufC::New(4);delete _a;if (_a==NULL)_r=KErrNoMemory;else _r=_x;}

    35 #define __TESTOOMD(_r, _x) TInt _r = KErrNone;{HBufC* _a=HBufC::New(4);delete _a;if (_a==NULL)_r=KErrNoMemory;else _r=_x;}

    36 #define __DEBUGTESTLEAVE {HBufC* _a=HBufC::NewL(4);delete _a;}

    37 

    38 #else

    39 

    40 #define __TESTOOM(_r, _x) _r = _x

    41 #define __TESTOOMD(_r, _x) TInt _r = _x

    42 #define __DEBUGTESTLEAVE

    43 

    44 #endif

    45 

    46 

    47 #endif // __TESTOOM_H__