diff -r 000000000000 -r 4e1aa6a622a0 sysstatemgmt/systemstatemgr/test/testapps/inc/ssmcletestapp.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/sysstatemgmt/systemstatemgr/test/testapps/inc/ssmcletestapp.h	Tue Feb 02 00:53:00 2010 +0200
@@ -0,0 +1,56 @@
+// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @test
+ @internalComponent - Internal Symbian test code
+*/
+
+#ifndef __SSMCLETESTAPP_H
+#define __SSMCLETESTAPP_H
+
+#include "ssmtestapps.h"
+
+const TInt KSsmCleTestPanic = 999;
+enum TCleTestFailHow
+	{
+	EDontFail,
+	EPanic,
+	ENoRendezvous,
+	EBadRendezvous,
+	EBadPath,
+	EMultipleTimeout
+	};
+
+struct TSsmCleTestAppArgs
+	{
+	TBuf<KTestCommandLineMaxLength> iLogPrefix;
+	TInt iWaitTime;
+	TInt iSucceedOnRun;
+	TCleTestFailHow iFailHow;
+	};
+
+class XSsmCleTestApp
+	{
+public:
+	static void WriteStartTimeL(RFs aFs, const TDesC& aLogPrefix);
+	static TInt GetRunCountL(RFs aFs, const TDesC& aLogPrefix);
+	static TInt IncrementRunCountL(RFs aFs, const TDesC& aLogPrefix);
+	static void GetCommandLineArgsL(TSsmCleTestAppArgs& aArgStruct);
+	static void WriteResultL(RFs aFs, const TDesC& aLogPrefix,const TCleTestFailHow& aFailHow);
+	};
+	
+#endif // __SSMCLETESTAPP_H