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1 // Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies). |
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2 // All rights reserved. |
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3 // This component and the accompanying materials are made available |
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4 // under the terms of "Eclipse Public License v1.0" |
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5 // which accompanies this distribution, and is available |
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6 // at the URL "http://www.eclipse.org/legal/epl-v10.html". |
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7 // |
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8 // Initial Contributors: |
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9 // Nokia Corporation - initial contribution. |
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10 // |
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11 // Contributors: |
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12 // |
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13 // Description: |
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14 // |
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15 |
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16 #include "tbitbltmasked.h" |
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17 |
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18 CTBitBltMasked::CTBitBltMasked() |
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19 { |
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20 SetTestStepName(KTDirectGdiBitBltMaskedStep); |
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21 } |
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22 |
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23 CTBitBltMasked::~CTBitBltMasked() |
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24 { |
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25 } |
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26 |
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27 /** |
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28 Override of base class pure virtual |
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29 Lists the tests to be run |
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30 */ |
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31 void CTBitBltMasked::RunTestsL() |
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32 { |
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33 if(iUseDirectGdi && !iUseSwDirectGdi) |
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34 { |
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35 // In the event that a test leaves after a BitBlt() or DrawBitmap() has occurred |
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36 // the vgimage cache will need to be reset. |
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37 // This needs to be the first item on the cleanupstack, |
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38 // as some tests perform pushes and pops of bitmaps. |
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39 CleanupStack::PushL(TCleanupItem(ResetCache, iVgImageCache)); |
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40 } |
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41 |
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42 BeginMaskIteration(); |
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43 // to minimize tests call number these tests are processed only for one mask |
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44 if(!iLargeTarget) |
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45 { |
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46 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0003")); |
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47 TestInvalidParametersL(); |
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48 RecordTestResultL(); |
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49 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0004")); |
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50 TestSourceBitmapCloningL(); |
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51 RecordTestResultL(); |
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52 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0005")); |
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53 TestMaskCloningL(); |
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54 RecordTestResultL(); |
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55 } |
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56 do |
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57 { |
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58 if(!iLargeTarget) |
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59 { |
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60 iTestParams.iDoCompressed = ETrue; |
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61 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0001")); |
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62 TestBasicL(); |
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63 RecordTestResultL(); |
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64 iTestParams.iDoCompressed = EFalse; |
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65 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0006")); |
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66 TestDrawModeL(); |
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67 RecordTestResultL(); |
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68 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0007")); |
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69 TestWithSameBitmapsL(); |
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70 RecordTestResultL(); |
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71 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0008")); |
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72 TestSetOriginL(); |
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73 RecordTestResultL(); |
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74 } |
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75 else |
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76 { |
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77 SetTestStepID(_L("GRAPHICS-DIRECTGDI-BITBLTMASKED-0002")); |
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78 TestPositioningL(); |
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79 RecordTestResultL(); |
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80 } |
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81 } |
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82 while(NextMaskIteration()); |
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83 |
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84 if(iUseDirectGdi && !iUseSwDirectGdi) |
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85 { |
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86 CleanupStack::PopAndDestroy(iVgImageCache); |
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87 } |
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88 } |
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89 |
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90 /** |
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91 @SYMTestCaseID |
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92 GRAPHICS-DIRECTGDI-BITBLTMASKED-0001 |
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93 |
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94 @SYMPREQ |
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95 PREQ39 |
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96 |
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97 @SYMREQ |
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98 REQ9198 |
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99 REQ9204 |
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100 REQ9195 |
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101 REQ9201 |
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102 REQ9202 |
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103 REQ9222 |
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104 REQ9223 |
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105 REQ9236 |
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106 REQ9237 |
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107 |
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108 @SYMTestCaseDesc |
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109 Bit blitting with masking basic functionality. |
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110 |
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111 @SYMTestPriority |
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112 Critical |
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113 |
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114 @SYMTestStatus |
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115 Implemented |
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116 |
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117 @SYMTestActions |
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118 Test bit blitting with masking for basic and valid parameters. |
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119 |
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120 @SYMTestExpectedResults |
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121 Source bitmap should be copied into target area. Basic or inverted |
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122 masking should be considered. Valid bitmap should be created. This |
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123 bitmap should be the same as a reference bitmap. |
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124 */ |
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125 void CTBitBltMasked::TestBasicL() |
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126 { |
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127 _LIT(KTestName, "BitBltMasked-Basic"); |
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128 _LIT(KTestNameNegative, "BitBltMasked-Basic-NegativeMaskPosition"); |
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129 if(!iRunningOomTests) |
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130 { |
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131 INFO_PRINTF1(KTestName); |
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132 } |
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133 |
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134 ResetGc(); |
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135 CFbsBitmap* bitmap; |
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136 CFbsBitmap* mask; |
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137 if(iTestParams.iDoCompressed) |
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138 { |
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139 bitmap = iCompressedBitmap; |
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140 mask = iCompressedMaskL8; |
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141 } |
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142 else |
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143 { |
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144 bitmap = iCheckedBoardBitmap2; |
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145 mask = iCurrentMask1; |
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146 } |
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147 |
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148 TRect bmpRect(TPoint(0, 0), bitmap->SizeInPixels()); |
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149 if(iMaskPixelFormat == EUidPixelFormatL_1) |
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150 { |
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151 iGc->BitBltMasked(TPoint(20, 20), *bitmap, bmpRect, *mask, iInvertMask); |
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152 iGc->BitBltMasked(TPoint(20, 20), *bitmap, bmpRect, *mask, ETrue); |
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153 } |
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154 else |
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155 { |
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156 iGc->BitBltMasked(TPoint(20, 20), *bitmap, bmpRect, *mask, TPoint(0, 0)); |
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157 } |
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158 TESTNOERROR(iGc->GetError()); |
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159 if(!iTestParams.iDoCompressed) |
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160 WriteTargetOutput(KTestName()); |
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161 |
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162 // negative mask position |
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163 iGc->BitBltMasked(TPoint(-35, 180), *bitmap, bmpRect, *iMask1L8, TPoint(-1, -1)); |
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164 TESTNOERROR(iGc->GetError()); |
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165 |
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166 // mask position greater than mask size |
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167 iGc->BitBltMasked(TPoint(-35, 200), *bitmap, bmpRect, *iMask1L8, iMask1L8->SizeInPixels().AsPoint()); |
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168 CheckErrorsL(KErrNone, KErrArgument, (TText8*)__FILE__, __LINE__); |
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169 |
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170 if(!iTestParams.iDoCompressed) |
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171 TESTNOERRORL(WriteTargetOutput(KTestNameNegative())); |
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172 } |
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173 |
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174 /** |
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175 @SYMTestCaseID |
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176 GRAPHICS-DIRECTGDI-BITBLTMASKED-0002 |
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177 |
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178 @SYMPREQ |
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179 PREQ39 |
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180 |
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181 @SYMREQ |
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182 REQ9197 |
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183 REQ9198 |
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184 REQ9204 |
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185 REQ9195 |
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186 REQ9201 |
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187 REQ9202 |
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188 REQ9222 |
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189 REQ9223 |
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190 REQ9236 |
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191 REQ9237 |
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192 |
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193 @SYMTestCaseDesc |
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194 Various combinations of destination positions, source position and size |
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195 of a bitmap are tested. Test also covers mask alignment, tiling and boundary |
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196 parameters. |
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197 |
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198 @SYMTestPriority |
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199 Critical |
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200 |
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201 @SYMTestStatus |
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202 Implemented |
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203 |
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204 @SYMTestActions |
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205 Covers the whole target bitmap starting from TPoint(-30,-30) with staggered blits of a small 8x8 bitmap. |
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206 Test positioning functionality of BitBltMasked() methods. Test boundary |
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207 conditions, tiling and clipping to surface area. |
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208 |
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209 @SYMTestExpectedResults |
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210 */ |
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211 void CTBitBltMasked::TestPositioningL() |
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212 { |
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213 _LIT(KTestName, "BitBltMasked-Positioning"); |
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214 if(!iRunningOomTests) |
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215 { |
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216 INFO_PRINTF1(KTestName); |
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217 } |
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218 iTestParams.iDoCompressed = ETrue; |
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219 TestPositioningBaseL(KTestName(), EBitBltMasked); |
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220 iTestParams.iDoCompressed = EFalse; |
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221 TestPositioningBaseL(KTestName(), EBitBltMasked); |
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222 } |
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223 |
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224 /** |
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225 @SYMTestCaseID |
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226 GRAPHICS-DIRECTGDI-BITBLTMASKED-0003 |
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227 |
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228 @SYMPREQ |
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229 PREQ39 |
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230 |
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231 @SYMREQ |
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232 REQ9197 |
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233 REQ9198 |
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234 REQ9204 |
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235 REQ9195 |
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236 REQ9222 |
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237 REQ9223 |
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238 REQ9236 |
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239 REQ9237 |
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240 |
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241 @SYMTestCaseDesc |
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242 Calling BitBltMasked() method with invalid parameters |
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243 |
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244 @SYMTestPriority |
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245 Critical |
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246 |
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247 @SYMTestStatus |
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248 Implemented |
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249 |
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250 @SYMTestActions |
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251 Invalid source rect: |
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252 - TRect(-30, -30, -10, -10); |
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253 - TRect(bmpWidth+10, bmpHeight+10, bmpWidth+20, bmpHeight+20); |
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254 - TRect(bmpWidth, bmpHeight, 0, 0); |
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255 - TRect(-10, -10, -30, -30); |
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256 - TRect(0, 0, 0, 0); |
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257 Invalid mask (aMaskBitmap): |
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258 - zero size mask |
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259 - not initialized mask |
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260 Mask position greater than mask size: aMaskPt = TPoint(mask_width, mask_height) |
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261 Invalid source bitmap: |
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262 - zero size bitmap |
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263 - not initialised bitmap |
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264 |
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265 @SYMTestExpectedResults |
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266 Function should detect invalid parameters and return. Nothing should be drawn |
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267 in a target area. |
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268 */ |
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269 void CTBitBltMasked::TestInvalidParametersL() |
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270 { |
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271 _LIT(KTestName, "BitBltMasked-InvalidParameters"); |
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272 if(!iRunningOomTests) |
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273 { |
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274 INFO_PRINTF1(KTestName); |
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275 } |
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276 TestInvalidParametersBaseL(KTestName(), EBitBltMasked); |
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277 } |
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278 |
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279 /** |
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280 @SYMTestCaseID |
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281 GRAPHICS-DIRECTGDI-BITBLTMASKED-0004 |
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282 |
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283 @SYMPREQ |
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284 PREQ39 |
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285 |
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286 @SYMREQ |
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287 REQ9197 |
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288 REQ9204 |
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289 REQ9195 |
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290 REQ9201 |
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291 REQ9202 |
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292 REQ9222 |
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293 REQ9223 |
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294 REQ9236 |
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295 REQ9237 |
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296 |
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297 @SYMTestCaseDesc |
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298 Tests that masked bitmaps are drawn correctly if they |
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299 are deleted immediately after BitBltMasked() is called, but before Finish() is called. |
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300 |
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301 @SYMTestPriority |
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302 Critical |
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303 |
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304 @SYMTestStatus |
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305 Implemented |
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306 |
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307 @SYMTestActions |
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308 Set valid mask parameters (see BitBltMasked-Basic). |
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309 For test description see BitBlt-SourceBitmapCloning. |
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310 |
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311 @SYMTestExpectedResults |
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312 Source bitmap should be copied into target area. Memory leaks should not |
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313 be created. Valid bitmap should be created. This bitmap should be |
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314 the same as a reference bitmap. |
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315 */ |
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316 void CTBitBltMasked::TestSourceBitmapCloningL() |
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317 { |
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318 _LIT(KTestName, "BitBltMasked-SourceBitmapCloning"); |
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319 if(!iRunningOomTests) |
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320 { |
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321 INFO_PRINTF1(KTestName); |
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322 } |
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323 iTestParams.iDoCompressed = ETrue; |
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324 TestSourceBitmapCloningBaseL(KTestName(), EBitBltMasked); |
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325 iTestParams.iDoCompressed = EFalse; |
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326 TestSourceBitmapCloningBaseL(KTestName(), EBitBltMasked); |
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327 } |
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328 |
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329 /** |
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330 @SYMTestCaseID |
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331 GRAPHICS-DIRECTGDI-BITBLTMASKED-0005 |
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332 |
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333 @SYMPREQ |
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334 PREQ39 |
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335 |
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336 @SYMREQ |
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337 REQ9197 |
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338 REQ9204 |
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339 REQ9195 |
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340 REQ9201 |
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341 REQ9202 |
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342 REQ9222 |
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343 REQ9223 |
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344 REQ9236 |
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345 REQ9237 |
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346 |
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347 @SYMTestCaseDesc |
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348 Tests that masked bitmaps are drawn correctly if the mask |
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349 is deleted immediately after BitBltMasked() is called, but before Finish() is called. |
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350 |
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351 @SYMTestPriority |
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352 Critical |
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353 |
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354 @SYMTestStatus |
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355 Implemented |
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356 |
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357 @SYMTestActions |
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358 1. Invoke the BitBltMasked() method with valid parameters (see BitBltMasked-Basic). |
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359 2. Right after returning from BitBltMasked() call, destroy the source mask (aMaskBitmap). |
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360 3. Call the BitBltMasked() method again with the same mask parameter. |
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361 Repeat p. 1-3 a few times. |
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362 |
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363 @SYMTestExpectedResults |
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364 Source bitmap should be copied into target area and should be correctly masked. |
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365 Memory leaks should not be created. Valid bitmap should be created. This bitmap |
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366 should be the same as a reference bitmap. |
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367 */ |
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368 void CTBitBltMasked::TestMaskCloningL() |
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369 { |
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370 _LIT(KTestName, "BitBltMasked-MaskCloning"); |
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371 if(!iRunningOomTests) |
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372 { |
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373 INFO_PRINTF1(KTestName); |
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374 } |
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375 iTestParams.iDoCompressed = ETrue; |
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376 TestMaskCloningBaseL(KTestName(), EBitBltMasked); |
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377 iTestParams.iDoCompressed = EFalse; |
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378 TestMaskCloningBaseL(KTestName(), EBitBltMasked); |
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379 } |
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380 |
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381 /** |
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382 @SYMTestCaseID |
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383 GRAPHICS-DIRECTGDI-BITBLTMASKED-0006 |
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384 |
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385 @SYMPREQ |
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386 PREQ39 |
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387 |
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388 @SYMREQ |
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389 REQ9198 |
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390 REQ9204 |
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391 REQ9195 |
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392 REQ9201 |
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393 REQ9202 |
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394 REQ9222 |
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395 REQ9223 |
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396 REQ9236 |
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397 REQ9237 |
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398 |
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399 @SYMTestCaseDesc |
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400 Test correctness of bit blitting with mask in all possible draw modes. |
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401 |
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402 @SYMTestPriority |
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403 Critical |
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404 |
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405 @SYMTestStatus |
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406 Implemented |
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407 |
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408 @SYMTestActions |
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409 Set valid parameters (see BitBltMasked-Basic). |
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410 Use the semi-transparent source bitmap (iCheckedBoardWithAlphaBitmap). |
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411 Set drawmode to EDrawModePEN and call the methods. |
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412 Set drawmode to EDrawModeWriteAlpha and call the methods. |
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413 |
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414 @SYMTestExpectedResults |
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415 Semi-transparent (for EDrawModePEN) and opaque (for EDrawModeWriteAlpha) |
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416 should be copied into rendering target. Valid bitmap should be created. |
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417 This bitmap should be the same as a reference bitmap. |
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418 */ |
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419 void CTBitBltMasked::TestDrawModeL() |
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420 { |
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421 _LIT(KTestName, "BitBltMasked-DrawMode"); |
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422 if(!iRunningOomTests) |
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423 { |
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424 INFO_PRINTF1(KTestName); |
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425 } |
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426 ResetGc(); |
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427 |
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428 TSize bmpSize(iCheckedBoardWithAlphaBitmap->SizeInPixels()); |
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429 |
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430 TInt halfHeight = (bmpSize.iHeight >> 1); |
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431 TInt quarterWidth = (bmpSize.iWidth >> 2); |
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432 TInt y1 = halfHeight - (bmpSize.iHeight >> 2); |
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433 TSize vertRectSize (quarterWidth, bmpSize.iHeight); |
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434 TSize horizRectSize (bmpSize.iWidth, halfHeight); |
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435 |
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436 // EDrawModeWriteAlpha is not supported in the following modes |
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437 // This is tested under invalid parameter tests. |
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438 if (!((iMaskPixelFormat == EUidPixelFormatL_8) && |
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439 ((iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888) || |
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440 (iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888_PRE)))) |
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441 { |
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442 // Render column to left |
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443 iGc->SetDrawMode(DirectGdi::EDrawModeWriteAlpha); |
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444 iGc->BitBltMasked( |
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445 TPoint(0, 0), |
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446 *iCheckedBoardWithAlphaBitmap, |
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447 TRect(TPoint(0, 0), vertRectSize), |
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448 *iCurrentMask2, |
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449 TPoint(0, 0)); |
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450 } |
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451 |
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452 // Render row in center |
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453 iGc->SetDrawMode(DirectGdi::EDrawModePEN); |
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454 iGc->BitBltMasked( |
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455 TPoint(0, y1), |
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456 *iCheckedBoardWithAlphaBitmap, |
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457 TRect(TPoint(0, 0), horizRectSize), |
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458 *iCurrentMask2, |
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459 TPoint(0, 0)); |
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460 |
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461 // EDrawModeWriteAlpha is not supported in the following modes |
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462 // This is tested under invalid parameter tests. |
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463 if (!((iMaskPixelFormat == EUidPixelFormatL_8) && |
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464 ((iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888) || |
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465 (iTestParams.iSourcePixelFormat == EUidPixelFormatARGB_8888_PRE)))) |
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466 { |
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467 // Render column to right |
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468 iGc->SetDrawMode(DirectGdi::EDrawModeWriteAlpha); |
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469 iGc->BitBltMasked( |
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470 TPoint(bmpSize.iWidth - quarterWidth, 0), |
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471 *iCheckedBoardWithAlphaBitmap, |
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472 TRect(TPoint(0, 0), vertRectSize), |
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473 *iCurrentMask2, |
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474 TPoint(0, 0)); |
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475 } |
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476 |
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477 TESTNOERRORL(iGc->GetError()); |
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478 |
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479 TESTNOERRORL(WriteTargetOutput(KTestName())); |
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480 } |
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481 |
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482 /** |
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483 @SYMTestCaseID |
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484 GRAPHICS-DIRECTGDI-BITBLTMASKED-0007 |
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485 |
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486 @SYMPREQ |
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487 PREQ39 |
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488 |
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489 @SYMREQ |
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490 REQ9198 |
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491 REQ9204 |
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492 REQ9195 |
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493 REQ9201 |
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494 REQ9202 |
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495 REQ9222 |
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496 REQ9223 |
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497 REQ9236 |
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498 REQ9237 |
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499 |
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500 @SYMTestCaseDesc |
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501 Test the basic functionality of bit blitting with masking. |
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502 |
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503 @SYMTestPriority |
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504 Critical |
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505 |
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506 @SYMTestStatus |
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507 Implemented |
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508 |
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509 @SYMTestActions |
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510 Test bit blitting with masking for same source and mask bitmaps. |
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511 |
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512 @SYMTestExpectedResults |
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513 Source bitmap should be copied into target area. Basic or inverted |
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514 masking should be considered. Valid bitmap should be created. This |
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515 bitmap should be the same as a reference bitmap. |
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516 */ |
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517 void CTBitBltMasked::TestWithSameBitmapsL() |
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518 { |
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519 _LIT(KTestName, "BitBltMasked-SameBitmaps"); |
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520 ResetGc(); |
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521 TRect bmpRect1(TPoint(0, 0), iBlackWhiteBitmap->SizeInPixels()); |
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522 iGc->SetOrigin(TPoint(30, 30)); |
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523 iGc->BitBltMasked(TPoint(0, 0), *iBlackWhiteBitmap, bmpRect1, *iBlackWhiteBitmap, ETrue); |
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524 iGc->BitBltMasked(TPoint(0, 0), *iBlackWhiteBitmap, bmpRect1, *iBlackWhiteBitmap, EFalse); |
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525 TESTNOERRORL(iGc->GetError()); |
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526 //Write target only if image is not empty. BitGDI is producing white images when Mask pixel format is EUidPixelFormatL_8 |
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527 TBool pass = TestTargetL(KRgbWhite); |
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528 if(!pass) |
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529 { |
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530 TESTNOERRORL(WriteTargetOutput(KTestName())); |
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531 } |
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532 } |
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533 |
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534 /** |
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535 @SYMTestCaseID |
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536 GRAPHICS-DIRECTGDI-BITBLTMASKED-0008 |
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537 |
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538 @SYMPREQ |
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539 PREQ39 |
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540 |
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541 @SYMREQ |
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542 REQ9198 |
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543 REQ9204 |
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544 REQ9195 |
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545 REQ9201 |
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546 REQ9202 |
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547 REQ9222 |
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548 REQ9223 |
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549 REQ9236 |
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550 REQ9237 |
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551 |
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552 @SYMTestCaseDesc |
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553 Test that BitBltMasked() performs correctly when it is called after SetOrigin(). |
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554 |
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555 @SYMTestPriority |
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556 Critical |
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557 |
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558 @SYMTestStatus |
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559 Implemented |
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560 |
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561 @SYMTestActions |
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562 Call SetOrigin(). |
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563 Call BitBltMasked(). |
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564 |
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565 @SYMTestExpectedResults |
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566 Source bitmap should be copied into target area. Basic or inverted |
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567 masking should be considered. Valid bitmap should be created. This |
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568 bitmap should be the same as a reference bitmap. |
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569 */ |
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570 void CTBitBltMasked::TestSetOriginL() |
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571 { |
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572 _LIT(KTestName, "BitBltMasked-SetOrigin"); |
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573 _LIT(KTestNameNegative, "BitBltMasked-SetOrigin-NegativeMaskPosition"); |
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574 |
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575 // Only do test for one pixel format to cut down on the number of images produced |
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576 // as this is just a positional test and we don't need to test for all pixel formats. |
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577 if (!((iTestParams.iTargetPixelFormat == EUidPixelFormatRGB_565) && (iTestParams.iSourcePixelFormat == EUidPixelFormatRGB_565))) |
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578 { |
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579 return; |
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580 } |
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581 |
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582 if(!iRunningOomTests) |
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583 { |
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584 INFO_PRINTF1(KTestName); |
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585 } |
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586 |
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587 ResetGc(); |
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588 CFbsBitmap* bitmap = iCheckedBoardBitmap2; |
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589 CFbsBitmap* mask = iCurrentMask1; |
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590 |
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591 TRect bmpRect(TPoint(0, 0), bitmap->SizeInPixels()); |
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592 iGc->SetOrigin(TPoint(-35, 80)); |
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593 if(iMaskPixelFormat == EUidPixelFormatL_1) |
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594 { |
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595 iGc->BitBltMasked(TPoint(55, -60), *bitmap, bmpRect, *mask, iInvertMask); |
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596 iGc->BitBltMasked(TPoint(55, -60), *bitmap, bmpRect, *mask, ETrue); |
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597 } |
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598 else |
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599 { |
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600 iGc->BitBltMasked(TPoint(55, -60), *bitmap, bmpRect, *mask, TPoint(0, 0)); |
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601 } |
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602 TESTNOERROR(iGc->GetError()); |
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603 TESTNOERRORL(WriteTargetOutput(KTestName())); |
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604 |
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605 // negative mask position |
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606 iGc->BitBltMasked(TPoint(0, 100), *bitmap, bmpRect, *iMask1L8, TPoint(-1, -1)); |
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607 TESTNOERROR(iGc->GetError()); |
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608 |
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609 // mask position greater than mask size |
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610 iGc->BitBltMasked(TPoint(0, 120), *bitmap, bmpRect, *iMask1L8, iMask1L8->SizeInPixels().AsPoint()); |
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611 CheckErrorsL(KErrNone, KErrArgument, (TText8*)__FILE__, __LINE__); |
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612 |
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613 TESTNOERRORL(WriteTargetOutput(KTestNameNegative())); |
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614 } |
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615 |
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616 |