diff -r 000000000000 -r 5d03bc08d59c graphicstest/uibench/src/tbitbltperf.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/graphicstest/uibench/src/tbitbltperf.h	Tue Feb 02 01:47:50 2010 +0200
@@ -0,0 +1,69 @@
+// Copyright (c) 2005-2009 Nokia Corporation and/or its subsidiary(-ies).
+// All rights reserved.
+// This component and the accompanying materials are made available
+// under the terms of "Eclipse Public License v1.0"
+// which accompanies this distribution, and is available
+// at the URL "http://www.eclipse.org/legal/epl-v10.html".
+//
+// Initial Contributors:
+// Nokia Corporation - initial contribution.
+//
+// Contributors:
+//
+// Description:
+//
+
+/**
+ @file
+ @test
+ @internalComponent - Internal Symbian test code 
+*/
+ 
+#ifndef __TBITBLTPERF_H__
+#define __TBITBLTPERF_H__
+
+#include "te_graphicsperformanceSuiteStepBase.h"
+#include <bitdev.h>
+
+class CTBitBltPerf : public CTe_graphicsperformanceSuiteStepBase
+	{
+public:
+	CTBitBltPerf();
+	~CTBitBltPerf();
+	
+private:
+	enum TBitBltTest
+		{
+		EBitBlt,
+		EBitBltMasked,		
+		};
+
+	void BitBltBitmapTestL(TBitBltTest aBitBltTest, CFbsBitmap* aBitmapToBlt,  CFbsBitmap* aBitmapMask, TRect aCropTo, TInt aOrientation, const TDesC& aTestName, CFbsBitGc* aGc);
+	void MultiBitBltBitmapTestL(TBitBltTest aBitBltTest, RArray<CFbsBitmap*> aBitmapArray, CFbsBitmap* aBitmapMask, TBool aCrop, const TDesC& aTestName, CFbsBitGc* aGc);
+	
+	void SimpleBitBltL();
+	void MaskedBitBltL();
+	void MaskedBitBltSameL();
+	void MaskedBitBltFlickerL();
+	void MaskedBitBltAlphaL();
+	void WriteAlphaLineExTestL();
+
+	// From CTestStep
+	virtual TVerdict doTestStepPreambleL();
+	virtual TVerdict doTestStepL();
+	
+private:
+	CFbsBitmapDevice* iBitmapDevice;
+	CFbsBitmap* iBitmap12bit;
+	CFbsBitmap* iBitmap16bit;
+	CFbsBitmap* iBitmap24bit;
+	CFbsBitmap* iBitmap32bit;
+	CFbsBitmap* iTile;
+	CFbsBitmap* iTile16bit;
+	CFbsBitmap* iTile32bit;
+	CFbsBitmap* iAlpha8bit;	
+	};
+
+_LIT(KTBitBltPerfName,"tbitbltperf");
+
+#endif