diff -r 000000000000 -r 469c91dae73b imagingext_pub/exif_api/tsrc/inc/TestFrameWork/TestResult.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/imagingext_pub/exif_api/tsrc/inc/TestFrameWork/TestResult.h	Thu Dec 17 09:22:31 2009 +0200
@@ -0,0 +1,72 @@
+/*
+* Copyright (c) 2002 Nokia Corporation and/or its subsidiary(-ies).
+* All rights reserved.
+* This component and the accompanying materials are made available
+* under the terms of "Eclipse Public License v1.0"
+* which accompanies this distribution, and is available
+* at the URL "http://www.eclipse.org/legal/epl-v10.html".
+*
+* Initial Contributors:
+* Nokia Corporation - initial contribution.
+*
+* Contributors:
+*
+* Description: ExifLibTest
+*
+*/
+
+
+
+#ifndef __CPPUNIT_TESTRESULT_H
+#define __CPPUNIT_TESTRESULT_H
+
+#include <e32base.h>
+
+class MTest;
+class CAssertFailure;
+class CTestFailure;
+
+
+/*
+ * A CTestResult collects the results of executing a test case. It is an 
+ * instance of the Collecting Parameter pattern.
+ *
+ * The test framework distinguishes between failures and errors.
+ * A failure is anticipated and checked for with assertions. Errors are
+ * unanticipated problems that are caused by "leaves" that are not generated
+ * by the framework.
+ *
+ * see MTest
+ */
+
+class CTestResult : public CBase
+	{
+public:
+
+	IMPORT_C static CTestResult* NewLC();
+	IMPORT_C static CTestResult* NewL();
+
+    IMPORT_C ~CTestResult ();
+
+    IMPORT_C TInt TestCount ();
+    IMPORT_C RPointerArray<CTestFailure>& Errors ();
+    IMPORT_C RPointerArray<CTestFailure>& Failures ();
+    IMPORT_C TBool WasSuccessful ();
+
+	void IncrementTestCount ();
+    void AddErrorL (MTest& aTest, TInt aError);
+    void AddFailureL (MTest& aTest, CAssertFailure* aAssertFailure);
+
+private:
+
+	void ConstructL ();
+	CTestResult ();
+
+    RPointerArray<CTestFailure> iErrors;
+    RPointerArray<CTestFailure> iFailures;
+	TInt iTestCount; 
+	};
+
+#endif
+
+