// Copyright (c) 2008-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of the License "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

// Hardware Configuration Respoitory Test Application

//

#define __E32TEST_EXTENSION__

#include <e32test.h>

#include <e32svr.h>

#include <u32hal.h>

#include <hal.h>

#include <hal_data.h>

#include "d_hcrut.h"

#define __TRACE_LINE__()	test.Printf(_L("%d\n"),__LINE__)

RTest test(_L("T_HCRUT"));

_LIT(KTestDriver,"d_hcrut");

RHcrTest HcrTest;

//---------------------------------------------

//! @SYMTestCaseID 

//! @SYMTestType

//! @SYMPREQ 

//! @SYMTestCaseDesc

//! @SYMTestActions 

//!

//! @SYMTestExpectedResults 

//!		

//! @SYMTestPriority 

//! @SYMTestStatus

//---------------------------------------------

TInt TestBasics ()

	{

	test.Next(_L("Switch repository test"));

	test_KErrNone( HcrTest.Test_SwitchRepository());

	// Wait for idle + async cleanup (waits for DKernelEventHandler to go away)

	TInt r = UserSvr::HalFunction(EHalGroupKernel, EKernelHalSupervisorBarrier, (TAny*)5000, 0);

	test_KErrNone(r);

    User::After(1000000);

    return KErrNone;

    }

GLDEF_C TInt E32Main()

    {

	TInt r;

    test.Title();

	test.Start(_L("=== HCR Test Suite"));

	test.Next(_L("=== Open test LDD"));

	r = User::LoadLogicalDevice(KTestDriver);

	test_Assert((r==KErrNone || r==KErrAlreadyExists),void (0));

	r = HcrTest.Open();

	test_KErrNone(r);

    // Do test cases

    //

    TestBasics();

	test.Next(_L("=== Close LDD"));

	HcrTest.Close();

	r = User::FreeLogicalDevice(RHcrTest::Name());

    test_KErrNone(r);

	test.End();

	return(KErrNone);

    }