// Copyright (c) 1995-2009 Nokia Corporation and/or its subsidiary(-ies).

// All rights reserved.

// This component and the accompanying materials are made available

// under the terms of the License "Eclipse Public License v1.0"

// which accompanies this distribution, and is available

// at the URL "http://www.eclipse.org/legal/epl-v10.html".

//

// Initial Contributors:

// Nokia Corporation - initial contribution.

//

// Contributors:

//

// Description:

// e32test\buffer\t_readar.cpp

// Overview:

// Test the CArrayFixFlat, CArrayPakFlat, CArrayVarFlat classes.

// API Information:

// CArrayFixFlat, CArrayPakFlat, CArrayVarFlat.

// Details:

// - Create an array of fixed length objects contained within a flat 

// dynamic buffer, append some elements onto the end of the array, 

// sort the array into key sequence, check the number of elements 

// in the array is as expected and read all of elements. Check 

// whether the heap has been corrupted.

// - Create an array of variable length objects implemented using a 

// flat dynamic buffer, append some elements onto the end of the 

// array, sort the array into key sequence, check the number of elements 

// in the array is as expected and read all of elements. Check whether 

// the heap has been corrupted.

// - Create an array of variable length objects packed into a flat buffer, 

// append some elements onto the end of the array, sort the array into 

// key sequence and check the number of elements held in the array is 

// as expected. Read all array elements. Check whether the heap has been 

// corrupted.

// - Check whether the heap has been corrupted by any of the tests.

// Platforms/Drives/Compatibility:

// All 

// Assumptions/Requirement/Pre-requisites:

// Failures and causes:

// Base Port information:

// 

//

#include <e32test.h>

const TInt KMaxStrings=3;

LOCAL_D RTest test(_L("T_READAR"));

LOCAL_D const TPtrC s1(_L("ZZZZ"));

LOCAL_D const TPtrC s2(_L("AAAA"));

LOCAL_D const TPtrC s3(_L("MMMM"));

LOCAL_D const TPtrC* str[KMaxStrings] = {&s1,&s2,&s3};

LOCAL_D const TPtrC* strSorted[KMaxStrings] = {&s2,&s3,&s1};

LOCAL_C void testReadAny(const TArray<TBufC<0x20> > anArray)

//

// Test with fixed length arrays.

//

	{

	test(anArray.Count()==KMaxStrings);

	for (TInt i=0;i<KMaxStrings;i++)

		test(anArray[i]==(*strSorted[i]));

	}

LOCAL_C void testFixL()

//

// Test with fixed length arrays.

//

	{

	__UHEAP_MARK;

//

	test.Start(_L("Creating Fix array"));

	CArrayFixFlat<TBufC<0x20> >* pFix=new(ELeave) CArrayFixFlat<TBufC<0x20> >(1);

	for (TInt i=0;i<KMaxStrings;i++)

		{

		TBufC<0x20> b=(*str[i]);

		pFix->AppendL(b);

		}

//

	test.Next(_L("Sorting Fix array"));

    TKeyArrayFix array(0,ECmpNormal);

	pFix->Sort(array);

//

	test.Next(_L("Reading Fix array"));

	testReadAny(pFix->Array());

//

	test.Next(_L("Destroying Fix array"));

	delete pFix;

	__UHEAP_MARKEND;

//

	test.End();

	}

LOCAL_C void testVarL()

//

// Test with variable length arrays.

//

	{

	__UHEAP_MARK;

//

	test.Start(_L("Creating Var array"));

	CArrayVarFlat<TBufC<0x20> >* pVar=new(ELeave) CArrayVarFlat<TBufC<0x20> >(1);

	for (TInt i=0;i<KMaxStrings;i++)

		{

		TBufC<0x20> b=(*str[i]);

		pVar->AppendL(b,b.Size()+sizeof(TUint));

		}

//

	test.Next(_L("Sorting Var array"));

    TKeyArrayVar array(0,ECmpNormal);

	pVar->Sort(array);

//

	test.Next(_L("Reading Var array"));

	testReadAny(pVar->Array());

//

	test.Next(_L("Destroying Var array"));

	delete pVar;

	__UHEAP_MARKEND;

//

	test.End();

	}

LOCAL_C void testPakL()

//

// Test with variable length packed arrays.

//

	{

	__UHEAP_MARK;

//

	test.Start(_L("Creating Pak array"));

	CArrayPakFlat<TBufC<0x20> >* pPak=new(ELeave) CArrayPakFlat<TBufC<0x20> >(1);

	for (TInt i=0;i<KMaxStrings;i++)

		{

		TBufC<0x20> b=(*str[i]);

		pPak->AppendL(b,b.Size()+sizeof(TUint));

		}

//

	test.Next(_L("Sorting Pak array"));

    TKeyArrayVar array(0,ECmpNormal);

	pPak->SortL(array);

//

	test.Next(_L("Reading Pak array"));

	testReadAny(pPak->Array());

//

	test.Next(_L("Destroying Pak array"));

	delete pPak;

	__UHEAP_MARKEND;

//

	test.End();

	}

GLDEF_C TInt E32Main()

//

// Test the Array classes.

//

    {

	test.Title();

	__UHEAP_MARK;

//

	test.Start(_L("Testing Fix arrays"));

	TRAPD(r,testFixL());

	test(r==KErrNone);

//

	test.Next(_L("Testing Var arrays"));

	TRAP(r,testVarL());

	test(r==KErrNone);

//

	test.Next(_L("Testing Pak arrays"));

	TRAP(r,testPakL());

	test(r==KErrNone);

//

	__UHEAP_MARKEND;

	test.End();

	return(0);

    }