kerneltest/f32test/demandpaging/t_ramstress.cpp
changeset 0 a41df078684a
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     1 // Copyright (c) 2007-2009 Nokia Corporation and/or its subsidiary(-ies).
       
     2 // All rights reserved.
       
     3 // This component and the accompanying materials are made available
       
     4 // under the terms of the License "Eclipse Public License v1.0"
       
     5 // which accompanies this distribution, and is available
       
     6 // at the URL "http://www.eclipse.org/legal/epl-v10.html".
       
     7 //
       
     8 // Initial Contributors:
       
     9 // Nokia Corporation - initial contribution.
       
    10 //
       
    11 // Contributors:
       
    12 //
       
    13 // Description:
       
    14 // f32test\demandpaging\t_ramstress.cpp
       
    15 // Following this, it requests that the driver continuously attempt 
       
    16 // to move pages directly.
       
    17 // Platforms/Drives/Compatibility:
       
    18 // Hardware only. No defrag support on emulator. 	
       
    19 // 
       
    20 //
       
    21 
       
    22 //! @SYMTestCaseID				KBASE-t_ramstress-0606
       
    23 //! @SYMTestType				CT
       
    24 //! @SYMTestCaseDesc			RAM Defrag background defrag stresser 
       
    25 //! @SYMPREQ					PREQ308
       
    26 //! @SYMTestPriority			High
       
    27 //! @SYMTestActions				t_ramstress loads and opens the logical device driver ("D_RAMSTRESS"). 
       
    28 //! @SYMTestExpectedResults		Finishes if the system behaves as expected, panics otherwise
       
    29 //! @SYMTestPriority			High
       
    30 //! @SYMTestStatus				Implemented
       
    31 //-------------------------------------------------------------------------------------------------
       
    32 #include <e32test.h>
       
    33 #include <u32hal.h>
       
    34 #include <f32file.h>
       
    35 #include <hal.h>
       
    36 #include "t_ramstress.h"
       
    37 
       
    38 RTest test(_L("T_RAMSTRESS"));
       
    39 
       
    40 RRamStressTestLdd  RamstressLdd;
       
    41 
       
    42 
       
    43 //
       
    44 // E32Main
       
    45 //
       
    46 // Main entry point.
       
    47 //
       
    48 
       
    49 TInt E32Main()
       
    50 	{
       
    51 	test.Title();
       
    52 	test.Start(_L("RAM Defrag background stress testing..."));
       
    53 
       
    54 	TBuf<256> args;
       
    55 	User::CommandLine(args);
       
    56 	TLex	lex(args);
       
    57 	TPtrC  token=lex.NextToken();
       
    58 	if (token.Length() != 0)
       
    59 		{
       
    60 		// exit immediately if we are run as part of autotest
       
    61 		test.End();
       
    62 		return KErrNone;
       
    63 		}
       
    64 
       
    65 	TInt r = User::LoadLogicalDevice(KRamStressTestLddName);
       
    66 	test(r==KErrNone || r==KErrAlreadyExists);
       
    67 	test(RamstressLdd.Open()==KErrNone);
       
    68 
       
    69 	TUint zoneCount = 0;
       
    70 	TInt ret = UserSvr::HalFunction(EHalGroupRam,ERamHalGetZoneCount,&zoneCount,0);
       
    71 	test(ret == KErrNone);
       
    72 	test(zoneCount != 0);
       
    73 
       
    74 	TUint index;
       
    75 	TInt iters = 0;
       
    76 	while (1)
       
    77 		{
       
    78 		for (index = 0; index < zoneCount; index ++)
       
    79 			{
       
    80 			RamstressLdd.DoMovePagesInZone(index);
       
    81 			User::AfterHighRes(1000);
       
    82 			}
       
    83 		//## mDH make it run forever iters ++;
       
    84 		if (iters > 1000000)
       
    85 			{
       
    86 			break;
       
    87 			}
       
    88 		}
       
    89 	RamstressLdd.Close();
       
    90 	test.Next(_L("Ram Defrag : Done"));
       
    91 	test.End();
       
    92 	return KErrNone;
       
    93 	}